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Selective Nucleation of Single Crystal CVD Diamond and its Applicability to Semiconductor Devices

Published online by Cambridge University Press:  26 February 2011

H. Kawarada
Affiliation:
Osaka Uiversity, Faculty of Engineering, Suita, Osaka, Japan.
J. S. MA
Affiliation:
Osaka Uiversity, Faculty of Engineering, Suita, Osaka, Japan.
T. Yonehara
Affiliation:
Canon Inc., Tamura, Hiratsuka, Kanagawa, Japan.
A. Hiraki
Affiliation:
Osaka Uiversity, Faculty of Engineering, Suita, Osaka, Japan.
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Abstract

Using selective nucleation at edges or corners of μ m-size dots of Si, periodically arrayed diamond particles have been reproducibly fabricated. The particles are grown from single nuclei and have nearly-single crystal features. The properties of the diamond arrays compared with polycrystalline films have been investigated using cathodoluminescence and Schottky diodes.

Type
Research Article
Copyright
Copyright © Materials Research Society 1990

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References

REFERENCES

[1] Yonehara, T., Nishigaki, Y., Mizutani, H., Kondoh, S., Yamagata, K., Noma, T., and Ichikawa, T., Appl. Phys. Lett. 52, 1231 (1988).Google Scholar
[2] Hirabayashi, K., Taniguchi, Y., Takamatsu, O., Ikeda, T., Ikoma, K., and Iwasakai-Kurihara, N., Appl. Phys. Lett. 53, 1815 (1988).Google Scholar
[3] Ma, J.S., Kawarada, H., Yonehara, T., Suzuki, J., Wei, J., Yokota, Y., and Hiraki, A., Appl. Phys. Lett. 55, 1071 (1989).Google Scholar
[4] Ma, J.S., Kawarada, H., Yonehara, T., Suzuki, J., Yokota, Y., and Hiraki, A., J. Cryst. Growth, (1990) (in press).Google Scholar
[5] Kawarada, H., Nishimura, K., Ito, T., Suzuki, J., Mar, K.S., Yokota, Y., and Hiraki, A., Jpn. J. Appl. Phys. 27, L683 (1988).Google Scholar
[6] Kawarada, H., Yokota, Y., Mori, Y., Nishimura, K., and Hiraki, A., J. Appl. Phys. 66, (1990) (appears in Jan. 15 th issue).Google Scholar
[7] Gildenblat, G.Sh., Grot, S.A., Wronski, C.R., Badzian, A.R., Badzian, T., and Messier, R., Appl. Phys. Lett. 53, 586 (1988).Google Scholar
[8] Kawarada, H., Yokota, Y., Mori, Y., Tomiyama, A., Ma, J.S., Wei, J., and Hiraki, A., Vacuum 40, (1990) (in press).Google Scholar
Mori, Y., Kawarada, H., and Hiraki, A., in Wide-Bandgap Semiconductors, edited by Glass, J.T., Messier, R., and Fujimori, N. (Mat. Res. Soc. Pro., Pittsburgh, PA 1990) (in this proceedings)Google Scholar