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Selection and Evaluation of Materials for Thermoelectric Applications II

Published online by Cambridge University Press:  15 February 2011

Jeff W. Sharp
Jeff W. Sharp*
Affiliation:
Marlow Industries, Inc., 10451 Vista Park Rd., Dallas, TX 75238–1645
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Abstract

In good thermoelectrics phonons have short mean free paths, and charge carriers have long ones. The other requirements are a multivalley band structure and a band gap greater than 0.1 eV for the 200 to 300 K temperature range. We discuss the use of solid state physics and chemistry concepts, along with atomic and crystal structure data, to select the new materials most likely to meet these criteria.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 478: Symposium Q – Thermoelectric Materials - New Directions and Approaches , 1997 , 15
Copyright
Copyright © Materials Research Society 1997

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References

1. Altenkirch, E., Phys. Zs. 10 (1909), 560; 12, p. 920 (1911).Google Scholar
2. Chasmar, RP. and Stratton, R., J. Electron. Control 7, p. 52 (1959).Google Scholar
3. Mahan, G.D., J. Appl. Phys. 65, p. 1578 (1989).Google Scholar
4. Spitzer, D.P., J. Phys. (hem. Sol. 31, p. 19 (1970).Google Scholar
5. Slack, G.A, Sol. St. Phys. 34, p. 1 (1979).Google Scholar
6. Slack, G.A. and Tsoukala, V.G., J. AppL. Phys. 76, p. 1665 (1994).Google Scholar
7. Morelli, D.T. and Meisner, G.P., J. Appl. Phys. 77, p.3777 (1995).Google Scholar
8. Nolas, G.S., Slack, G.A., Morelli, D.T., Tritt, T.M. and Ehrlich, E.C., .J. Appl. Phys. 79, p. 4002 (1996).Google Scholar
9. Watson, R.E. and Bennett, L.H., Phys. Rev. B 18, p. 6439 (1978); J. Phys. Chem. Sol. 39, p. 1235 (1978).Google Scholar
10. Martynov, A-I. and Batsanov, S.S., Russ.J. Of Inorg. Chem. 25, p. 1737 (1980).Google Scholar
11. Ghanty, T.K. and Ghosh, S.K.,.. Phys. Chem. 100, p. 17429 (1996).Google Scholar
12. Bergmann, D. and Hinze, J., Angew. Chem. In,. Ed. Engl. 35, p. 150 (1996).Google Scholar
13. Mahan, G.D. and Sofo, J-O., Proc. Nat. Acad. Sci. USA 93, p. 7436 (1996).Google Scholar
14. Mahan, G.D., Sales, B.C. and Sharp, J.W., Physics Today 50, #3, p. 42 (1997).Google Scholar
15. Source of electronegativity data: Lange's Handbook of Chemistry, 14th Ed., edited by Dean, John A. (McGraw-Hill, New York, 1992), p. 4.12.Google Scholar
16. Lii, K.-H. and Haushalter, R.C., J. Sol. St. Chem. 67, p. 374 (1987).Google Scholar
17. Schmidt, P.C., Stahl, D., Eisenmann, B., Kniep, R., Eyert, V. and Kubler, J., J Sol St. Chem. 97, p. 93 (1992).Google Scholar
18. Mooser, E and Pearson, W.B., Phys. Rev. 101, p. 1608 (1956); J Electronics 1, p. 629 (1956).Google Scholar
19. Corbett, J.D., Chem. Rev. 85, p. 383 (1985); H.-G.von Schnering and Wolfgang Hönle, 88, p. 243 (1988).Google Scholar
20. Eisenmann, B., Angew. Chem. Int. Ed Engl. 32, p. 1693 (1993).Google Scholar
21. Muiller, U., Inorganic Structural Chemistry, (John Wiley & Sons, NY, 1991), ch. 8.Google Scholar
22. Bauhofer, W., Gmelin, E., Mollendorf, M., Nesper, R. and Schnerring, H.G. von, J. Phys. C: Sol. St. Phys. 18, p. 3017 (1985).Google Scholar
23. Goldsmid, H.J., Electronic Refrigeration, (Plenum Press, New York, 1986), pp 58–62.Google Scholar
24. Callaway, J. and Baeyer, H.C. von, Phys. Rev. 120, p. 1149 (1960); B. Abeles, 131, p. 1906 (1963).Google Scholar
25. Goldsmid, HI. and Sharp, J.W., in preparation.Google Scholar
26. Daams, J.L.C., Vucht, J.H.N. van, J. Alloys Comp. 182, p. 1 (1992).Google Scholar