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A Scanning Force Microscopy Study of Block Copolymers Containing a Conjugated Segment

Published online by Cambridge University Press:  10 February 2011

Ph. Leclère ,
R. Lazzaroni ,
V. Parente ,
B. François  and
J. L. Brédas
Ph. Leclère
Affiliation:
Service de Chimie des Matériaux NouveauxCentre de Recherche en Electronique et Photonique MoléculairesUniversité de Mons-HainautPlace du Parc 20, B-7000 Mons (Belgium)
R. Lazzaroni
Affiliation:
Service de Chimie des Matériaux NouveauxCentre de Recherche en Electronique et Photonique MoléculairesUniversité de Mons-HainautPlace du Parc 20, B-7000 Mons (Belgium)
V. Parente
Affiliation:
Service de Chimie des Matériaux NouveauxCentre de Recherche en Electronique et Photonique MoléculairesUniversité de Mons-HainautPlace du Parc 20, B-7000 Mons (Belgium)
B. François
Affiliation:
Laboratoire de Recherche sur les Matériaux Polymères, CNRS/UPPAAvenue du Président Angot 2, F-64000 Pau (France)
J. L. Brédas
Affiliation:
Service de Chimie des Matériaux NouveauxCentre de Recherche en Electronique et Photonique MoléculairesUniversité de Mons-HainautPlace du Parc 20, B-7000 Mons (Belgium)
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Abstract

Atomic Force Microscopy (AFM) and related techniques are used to investigate the morphology of diblock copolymers. We focus on compounds containing a conjugated segment, polyparaphenylene, associated to a polymethylmethacrylate or a polystyrene block. The influence of the presence of the conjugated segment on the microdomain morphology is analyzed as a function of chain composition. Separate microdomains are observed on the surface of thin films by means of phase-detection imaging tapping-mode AFM. Their shape and size are interpreted in terms of molecular aggregation, with the help of molecular dynamics calculations.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 488: Symposium J – Electrical, Optical & Magnetic Properties of Organic IV , 1997 , 395
Copyright
Copyright © Materials Research Society 1998

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