Hostname: page-component-586b7cd67f-tf8b9 Total loading time: 0 Render date: 2024-11-20T09:26:40.807Z Has data issue: false hasContentIssue false
  • English
  • Français

Role of Surface Steps in Thin Film Growth and Properties Studied by Leem

Published online by Cambridge University Press:  21 February 2011

M. S. Altman ,
Q. Cai ,
W. F. Chung ,
E. Z. Luo ,
H. Pinkvos  and
E. Bauer
M. S. Altman
Affiliation:
Department of Physics, Hong Kong University of Science and Technology, Clear Water Bay, Kowloon, Hong Kong
Q. Cai
Affiliation:
Department of Physics, Hong Kong University of Science and Technology, Clear Water Bay, Kowloon, Hong Kong
W. F. Chung
Affiliation:
Department of Physics, Hong Kong University of Science and Technology, Clear Water Bay, Kowloon, Hong Kong
E. Z. Luo
Affiliation:
Department of Physics, Hong Kong University of Science and Technology, Clear Water Bay, Kowloon, Hong Kong
H. Pinkvos
Affiliation:
Department of Physics, Hong Kong University of Science and Technology, Clear Water Bay, Kowloon, Hong Kong
E. Bauer
Affiliation:
Physikalisches Institut, Technische Universität Clausthal, Leibnizstrasse 4, D-38678 Clausthal- Zellerfeld, Germany
Get access

Abstract

Atomic steps are a common defect at surfaces. Observations made with low energy electron microscopy are presented which demonstrate the impact of steps in growth, phase transitions, magnetic and orientational properties of thin films and clusters at surfaces. Most of these observations can be explained if steps modify the overlayer strain or interface energy.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 355: Symposium B1 – Evolution of Thin-Film and Surface Structure and Morphology , 1994 , 235
Copyright
Copyright © Materials Research Society 1995

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Bales, G.S. and Zangwill, A., Phys. Rev. B41, 5500 (1990).Google Scholar
2. Kandel, D. and Weeks, J.D., Phys. Rev. Lett. 69, 3758 (1992).Google Scholar
3. van der Merwe, J.H. and Shiflet, G.J., Acta Met. et Mat. 42, 1173 (1994); 42, 1189 (1994); 42, 1199 (1994); Met. Mat. Trans. A25, 1895 (1994).Google Scholar
4. Flynn, C.P., MRS Bulletin 16, 30 (1991).Google Scholar
5. Bauer, E., Repts. Prog. Phys. (in press).Google Scholar
6. Telieps, W., Mundschau, M., and Bauer, E., Optik 77, 93 (1987).Google Scholar
7. Altman, M.S. and Chung, W.F., Proceedings of the 13th International Congress on Electron Microscopy, Paris, France, July 17–22, 1994, pp. 1025–1026.Google Scholar
8. Kastler, A., Revue D'optique 29, 307 (1950).Google Scholar
9. Altman, M.S., Pinkvos, H., Hurst, J., Marx, G., Poppa, H., and Bauer, E. in Magnetic Materials: Microstructure and Properties, edited by Suzuki, T. (Mat. Res. Soc. Symp. Proc. 232, Pittsburgh, PA, 1991) pp. 125–132.Google Scholar
10. Grzelakowski, K., Duden, T., Bauer, E., Poppa, H., and Chiang, S., Proceedings MMM Intermag '94 Albuquerque, U.S.A., June, 1994.Google Scholar
11. Kirschner, J., Polarized Electrons at Surfaces, (Springer, Berlin, 1985).Google Scholar
12. Chappert, C. and Bruno, P., J. Appl. Phys. 64, 5736 (1988).Google Scholar
13. Altman, M.S., Pinkvos, H., and Bauer, E., Proceedings of the Magneto-Optical Recording International Symposium '94, Tokyo, Japan, September 26–29, 1994.Google Scholar
14. Allenspach, R., Stampanoni, M., and Bischof, A., Phys. Rev. Lett. 65, 3344 (1990).Google Scholar
15. Bauer, E., Poppa, H., Todd, G., and Davis, P.R., J. Appl. Phys. 48, 3773 (1977).Google Scholar
16. Kohlhepp, J., Elmers, H.J., and Gradmann, U., J. Mag. Mag. Mat. 121, 487 (1993).Google Scholar
17. Green, A.K., Prigge, S., and Bauer, E., Thin Solid Films 52, 163 (1978).Google Scholar
18. Bauer, E., Appl. Surf. Sci. 11/12, 479 (1982).Google Scholar
19. Zinke-Almange, M., Feldman, L.C., and Grabow, M.H., Surf. Sci. Repts. 16, 337 (1992).Google Scholar
20. Kofman, R., Cheyssac, P., Aouaj, A., Lereah, Y., Deutscher, G., Ben-David, T., Penisson, J.M., and Bourret, A., Surf. Sci. 303, 231 (1994).Google Scholar
21. Meyer, G., Michailov, M., and Henzler, M., Surf. Sci. 202 125 (1988).Google Scholar
22. Métois, J.J., and Heyraud, J.C., J. Phys. F 50, 3175 (1989).Google Scholar
23. Pavlovska, A., Faulian, K., and Bauer, E., Surf. Sci. 221, 233 (1989).Google Scholar
24. Métois, J.J. and Le Lay, G., Surf. Sci. 133, 422 (1983).Google Scholar
25. Miedema, A.R. and Boom, R., Z. Metallkd. 69, 183 (1978);Google Scholar
Miedema, A.R., Z. Metallkd., 69, 287 (1978).Google Scholar