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Resonance between Channeled Particle Wavelengths and Periodicity of Strained-Layer Superlattices

Published online by Cambridge University Press:  22 February 2011

W. K. Chu ,
S. T. Picraux ,
R. M. Biefeld ,
G. C. Osbourn  and
J. A. Ellison
W. K. Chu
Affiliation:
Department of Physics and Astronomy, University of North Carolina, Chapel Hill, NC, 27514
S. T. Picraux
Affiliation:
Sandia National Laboratories, Albuquerque, NM 87185
R. M. Biefeld
Affiliation:
Sandia National Laboratories, Albuquerque, NM 87185
G. C. Osbourn
Affiliation:
Sandia National Laboratories, Albuquerque, NM 87185
J. A. Ellison
Affiliation:
Department of Mathematics, University of New Mexico, Albuquerque, NM 87131
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Abstract

Recent studies of the resonance effect between the wavelength of planar channeled ions and the periodicity of strained-layer superlattices are summarized for MeV 4He ions backscattering from GaAsxP1-X/GaP superlattices. When the incident beam energy is adjusted so the half-wavelength matches the thickness of the layers, a catastrophic dechanneling effect is observed. A simple phase rotation analysis has been developed to calculate the dechanneling in each layer and good agreement is obtained with the observed dechanneling per interface. This resonance effect is used to measure the amount of strain in the GaAsxP1-x/GaP strained-layer superlattice.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 25: Symposium C – Thin Films and Interfaces II , 1983 , 483
Copyright
Copyright © Materials Research Society 1984

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References

REFERENCES

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