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Real-Time Viewing Of Dynamic Processes On Cdte Surfaces At Elevated Temperature

Published online by Cambridge University Press:  15 February 2011

David J. Smith
Affiliation:
Center for Solid State Science & Dept.of Physics, Arizona State University,Tempe, AZ 85287
R. Vogl
Affiliation:
Center for Solid State Science & Dept.of Physics, Arizona State University,Tempe, AZ 85287
Ping Lu
Affiliation:
Present address: Dept. of Mechanics and Materials Science, Rutgers University, Piscataway, NJ 08855
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Abstract

Online video recording with a high-resolution electron microscope has been used to study real-time atomic events occurring at cadmium telluride surfaces over a range of temperatures from 27°C to 500°C. Using the profile imaging mode of observation, different types of surface activity have been documented on (001), (111) and (110) surfaces. For example, the (001) surfaces displayed reversible phase transformations between 2× 1 and 3×1 reconstructions at a transition temperature of about 200°C. The (111) surfaces exhibited sublimation by a ledge mechanism that depended upon the terminating surface: layer-by-layer removal invariably occurred for (110) surface terminations whereas bilayer removal was usually seen for terminations by (100) surfaces. Finally, the (110) surface rearranged by a hopping mechanism, but no substantial loss of material was observed.

Type
Research Article
Copyright
Copyright © Materials Research Society 1993

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References

[1] Smith, D.J., J. Vac. Sci. Technol., B 3, 1563 (1985).Google Scholar
[2] Sinclair, R., Yamashita, T. and Ponce, FA, Nature, 290,386 (1981).Google Scholar
[3] Smith, D.J. and Marks, L.D., Mater. Res. Soc. Symp. Proc., 41, 129 (1985)CrossRefGoogle Scholar
[4] Sinclair, R., Parker, M.A. and Kim, K.B., Ultramicroscopy, 23, 383 (1987).Google Scholar
[5] Kahn, A, Surf. Sci. Reports 3, 193 (1983).CrossRefGoogle Scholar
[6] Lu, P. and Smith, D.J., Surface Sci., 254, 119 (1991).CrossRefGoogle Scholar
[7] Smith, D.J., Podbrdsky, J., Swann, P.R. and Jones, J.S., Mater. Res. Soc. Symp. Proc., 139, 289 (1989).Google Scholar
[8] Lu, P. and Smith, D.J., in Proc. XIIth. Int. Cong. for E.M., Vol.1, 310 (1990).Google Scholar
[9] McCartney, M.R. and Smith, D.J., Surface Sci., 250, 169 (1991).Google Scholar