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Rapid Thermal Annealing on Cu(In,Ga)Se2 Films and Solar Cells

Published online by Cambridge University Press:  01 February 2011

Xuege Wang ,
Sheng. S. Li ,
V. Craciun ,
S. Yoon ,
J. M. Howard ,
S. Easwaran ,
O. Manasreh ,
O. D. Crisalle  and
T. J. Anderson
Xuege Wang
Affiliation:
Dept. of Electrical and Computer Engineering,Univ. of Florida, Gainesville, FL 32611
Sheng. S. Li
Affiliation:
Dept. of Electrical and Computer Engineering,Univ. of Florida, Gainesville, FL 32611
V. Craciun
Affiliation:
Dept. of Material Science and Engineering, Univ. of Florida, Gainesville, FL 32611
S. Yoon
Affiliation:
Dept. of Chemical Engineering, Univ. of Florida, Gainesville, FL 32611
J. M. Howard
Affiliation:
Dept. of Material Science and Engineering, Univ. of Florida, Gainesville, FL 32611
S. Easwaran
Affiliation:
Dept. of Electrical Engineering, Univ. of Arkansas, Fayetteville,AR 72701
O. Manasreh
Affiliation:
Dept. of Electrical Engineering, Univ. of Arkansas, Fayetteville,AR 72701
O. D. Crisalle
Affiliation:
Dept. of Chemical Engineering, Univ. of Florida, Gainesville, FL 32611
T. J. Anderson
Affiliation:
Dept. of Chemical Engineering, Univ. of Florida, Gainesville, FL 32611
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Abstract

Rapid thermal annealing (RTA), with fast ramp up and down rates, was performed on several Cu(In,Ga)Se2 (CIGS) films and solar cells under various peak annealing temperatures and holding times. The XRD, SEM, Hall- effect, photo J-V, and quantum efficiency (Q-E) measurements were made on CIGS films and cells before and after RTA treatments to study the effects of RTA on the CIGS film properties and cell performance. The results show that RTA treatments under optimal annealing condition can provide significant improvements in the electrical properties (resistivity, carrier concentration, and mobility) of CIGS films and cell performance while preserving the film composition and microstructure morphology.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 865: Symposium F – Thin-Film Compound Semiconductor Photovoltaics , 2005 , F14.31
Copyright
Copyright © Materials Research Society 2005

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References

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