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Rapid Depth-Resolved Analysis of Nitride Layers (>50 Micrometers) on Prosthetic Devices by Radio Frequency Glow Discharge Atomic Emission Spectroscopy

Published online by Cambridge University Press:  15 February 2011

R. Kenneth
Affiliation:
Department of Chemistry, Clemson University, Clemson, SC 29634, [email protected]
Matthew L. Hartenstein
Affiliation:
Department of Chemistry, Clemson University, Clemson, SC 29634, [email protected]
Richard Compton
Affiliation:
Zimmer Inc., Boggs Industrial Park, PO Box 708, Warsaw, IN 46581-0708
Ravi Shetty
Affiliation:
Zimmer Inc., Boggs Industrial Park, PO Box 708, Warsaw, IN 46581-0708
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Abstract

The ability to provide depth-resolved chemical information is an important attribute for analytical methods employed in the biomaterials laboratory, both research and production. Radio frequency glow discharge atomic emission spectroscopy (rf-GD-AES) is shown to provide profiles of nitrogen content in prosthetic alloys to depths of greater than 50 micrometers, with analysis times of less than 30 minutes.

Type
Research Article
Copyright
Copyright © Materials Research Society 1999

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