Hostname: page-component-745bb68f8f-b6zl4 Total loading time: 0 Render date: 2025-02-10T08:12:30.219Z Has data issue: false hasContentIssue false
  • English
  • Français

Raman Spectrum of Graphene Coated Nano-Holes

Published online by Cambridge University Press:  01 February 2011

Amrita Banerjee ,
Ruiqiong Li  and
Haim Grebel
Amrita Banerjee
Affiliation:
[email protected], New Jersey Institute of Technology, Electrical and Computer Engineering, 14 Bellair Place, Floor# 2, Newark, NJ, 07104, United States, 862-220-9024
Ruiqiong Li
Affiliation:
[email protected], New Jersey Institute of Technology, Electronic Imaging Center, 161 Warren Street, Newark, NJ, 07102, United States
Haim Grebel
Affiliation:
[email protected], New Jersey Institute of Technology, Electronic Imaging Center, 161 Warren Street, Newark, NJ, 07102, United States
Get access

Abstract

It was assumed in the past that aluminum is not a platform of choice for surface enhanced Raman scattering (SERS) experiments: this was in spite of its large negative permittivity value, larger than gold or silver at optical wavelength. It was also assumed that any oxide on top of metallic platform significantly hinders SERS signals. In addition, graphene has not been studied on perforated substrates. Here we use periodically perforated and oxidized aluminum surfaces to examine electrical and optical properties of multi layered graphene. Linear and nonlinear optical methods were used to characterize single and multi layered structures.

Keywords

Raman spectroscopynanostructureoptoelectronic
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 1059: Symposium KK – Nanoscale Pattern Formation , 2007 , 1059-KK10-26
Copyright
Copyright © Materials Research Society 2008

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Novoselov, K.S., Geim, A.K., Morozov, S.V., Jiang, D., Zhang, Y., Dubonos, S.V., Grigorieva, I.V. and Firsov, A.A., Science 306, 666 (2004).Google Scholar
2. Zhang, Y., Small, J.P., Amori, M.E.S., and Kim, P., Appl. Phys. Lett. 86, 073104 (2005).Google Scholar
3. Graf, D., Molitor, F., Ensslin, K., Stampfer, C., Jungen, A., Hierold, C. and Wirtz, L., Solid State Communications 143, 44 (2007).Google Scholar
4. Ferrari, A.C., Meyer, J.C., Scardaci, V., Casiraghi, C., Lazzeri, M., Mauri, F. and Piscanec, S., Phys. Rev. Lett. 97, 187401 (2006).Google Scholar
5. Zhang, C., Abdijalov, K. and Grebel, H., J. Chem. Phys. 127, 044701 (2007).Google Scholar
6. Grebel, H., Iqbal, Z. and Lan, A., Chem. Phys. Lett. 348, 203 (2001).Google Scholar
7. Zhang, C., Smirnov, A., Hahn, D. and Grebel, H., Chem Phys. Letts, 440, 239 (2007).Google Scholar
8. Graf, D., Molitor, F., Ensslin, K., Stampfer, C., Jungen, A., Hierold, C. and Wirtz, L., Nano Lett. 7, 238 (2007).Google Scholar
9. Novoselov, K. S., Jiang, D., Schedin, F., Booth, T. J., Khotkevich, V. V., Morozov, S. V. and Geim, A. K., PNAS 102, 30 (2005).Google Scholar