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Raman and Rayleigh Smart Imaging of Nanophases and Nanosized Materials. Alternatives Techniques to SEM, TEM and AFM ?

Published online by Cambridge University Press:  01 February 2011

Philippe Colomban  and
Mickaël Havel
Philippe Colomban
Affiliation:
Ladir, UMR 7075 CNRS & Université Pierre & Marie Curie, 2 rue Henry-Dunant, 94320 Thiais, France
Mickaël Havel
Affiliation:
Ladir, UMR 7075 CNRS & Université Pierre & Marie Curie, 2 rue Henry-Dunant, 94320 Thiais, France
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Abstract

The imaging of nanostructural and topological variations on mechanically or chemically aged SiC materials has been performed using non-destructive Raman and Rayleigh μ-spectrometries. The case of a Hi-Nicalonf/(SiC/BN/C)m composite, corroded under alkali and oxidizing environment (modelled using molten NaNO3), is discussed. It is shown for the first time that Rayleigh imaging offers a competitive alternative to AFM measurements for un-prepared, very corrugated surface of materials containing carbon as a second phase. A comparison is made to the analysis of μ-indented areas performed on a polished section of the Ø∼140 μm SCS-6™ Textron SiC fibre. The “smart” Raman images allowed determining the strain distribution within the whole indented area.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 838: Symposium O – Scanning Probe and Other Novel Microscopies of Local Phenomena in Nanostructured Materials , 2004 , O14.2
Copyright
Copyright © Materials Research Society 2005

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References

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