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Quantitative Eels Profiling of Planar Faults in CaTiO3 Perovskite Approaching Atomic Resolution: A Comparison With Z-Contrast Imaging

Published online by Cambridge University Press:  10 February 2011

Hui Gu  and
Miran Čeh
Hui Gu
Affiliation:
Japan Science and Technology Corporation, “Ceramics Superplasticity” project, JFCC 2F, 2–4–1 Mutsuno, Atsuta, Nagoya 456, Japan
Miran Čeh
Affiliation:
“J. Stefan” Institute, University of Ljubljana, Jamova 39, 61111 Ljubljana, Slovenia
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Abstract

Using EELS profiling, CaO planar faults of 1.36 nm spacing in CaTiO3 are resolved. Effective probe size was measured as 1.3 nm by quantitative analysis of EELS profiles, which is remarkably larger than 0.5 nm resolution for Z-contrast in similar conditions. Delocalization in EELS is the origin for this discrepancy, and strong elastic scattering near zone axis plays an important role in the quantification of profiles. Suitable spectrum subtraction successfully separates ELNES signal from the fault in one atomic distance with rock-salt structure. ELNES profiles for different local structures are also achieved. These examples demonstrate that EELS analysis can be performed reliably approaching atomic level, beyond the limit of probe size.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 466: Symposium G – Atomic Resolution Microscopy of Surfaces and Interfaces , 1996 , 253
Copyright
Copyright © Materials Research Society 1997

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References

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