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Quantification of Trace and Ultra-trace Elements in Nuclear Grade Manufactured Graphites by Fast-Flow Glow Discharge Mass Spectrometry and by Inductively Coupled Plasma – Mass Spectrometry after Microwave – Induced Combustion Digestions

Published online by Cambridge University Press:  31 January 2011

Xinwei Wang ,
Gaurav Bhagat ,
Kevin Michael O'Brien  and
Karol Putyera
Xinwei Wang
Affiliation:
[email protected], EAG-NY, Shiva Technologies, Syracuse, New York, United States
Gaurav Bhagat
Affiliation:
[email protected], EAG-NY, Shiva Technologies, Syracuse, New York, United States
Kevin Michael O'Brien
Affiliation:
[email protected], EAG-NY, Shiva Technologies, Syracuse, New York, United States
Karol Putyera
Affiliation:
[email protected]@eaglabs.com, EAG-NY, Shiva Technologies, 6707 Brooklawn parkway, Syracuse, New York, 13211, United States, 3154319900, 3154319800
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Abstract

FF-GDMS and MIC-ICP-MS methods were developed for the determination of mg/kg- and μg/kg-level B, Mg, Al, Ca, Ti, V, Cr, Mn, Fe, Co, Ni, Cu, Zn, Zr, Mo, Sb, W and Pb in nuclear-grade graphite. Consistent results have been achieved in determining trace elements like B, Ti, Cr, Mn, Zr, Sb and Pb by both methods, which vary mostly less than ±30%, and are in line with the manufacturer reference values. On Mg, Al, Fe, Co, Zn, Mo and W, FF-GDMS analyses also show good agreement with the manufacturer's data. Continuing efforts in identifying source of interference, which has limited the MIC-ICP-MS analysis of these elements, is currently underway.

Keywords

mass spectroscopynuclear materialschemical composition
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 1215: Symposium V – Materials Research Needs to Advance Nuclear Energy , 2009 , 1215-V16-09
Copyright
Copyright © Materials Research Society 2010

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