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Pulsed Laser Deposition of Stable Cubic ZnO/MgO Multilayers
Published online by Cambridge University Press: 11 February 2011
Abstract
Wide bandgap (∼6 eV) ZnO/MgO multilayer thin films have been fabricated using pulsed laser deposition technique from their respective targets on c-plane Al2O3 substrates. The thickness of single ZnO sublayer thickness was varied in the range of 0.75–2.5 nm with a fixed MgO sublayer thickness of 1 nm in order to achieve a total film thickness of ∼300 nm. The structural transition from hexagonal to cubic phase was observed with the decrease in the thickness of single ZnO layer from 2.5 to 0.75 nm that resulted in the increase in bandgap from 3.5 to 6.2 eV. Mg contents of the films were increased from 40 % to 60 % for hexagonal and cubic phases, respectively. The surface roughness and grain structure were not influenced much with the increase of Mg concentration. Resistivity of the films was increased six orders of magnitude with the increase in Mg incorporation. The post annealing at 750° C did not show any significant change in the crystal structure and the optical properties.
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- Copyright © Materials Research Society 2003