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Pulsed Excimer Laser Photoablation by Backside Irradiation of Thin Metal Coated Polymer Films

Published online by Cambridge University Press:  15 February 2011

Stefan Lätsch  and
Hiroyuki Hiraoka
Stefan Lätsch
Affiliation:
Hong Kong University of Science and Technology, Clearwater Bay,Kowloon, Hong Kong
Hiroyuki Hiraoka
Affiliation:
Hong Kong University of Science and Technology, Clearwater Bay,Kowloon, Hong Kong
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Abstract

Backside laser irradiation of metal coated quartz wafers can be used for transferring material imagewise to a target cleanly in absence of chemical vapors. However, the transfer of metal from a quartz surface requires a high energy, resulting in poor quality images in some cases.

Use of a fluorinated polymer layer between the polycarbonate substrate and a Te-Se metal alloy is known for clean fabrication of metal holes in write-once-read-only memory media. Polymer thin films can be used similarly in backside laser irradiation for metal ejection from substrate surfaces.

With an ArF excimer laser at 193 nm, gold and aluminum were ejected imagewise from Teflon AF, poly(methacrylonitrile) and quartz surfaces. The threshold fluences of 230 Å thick gold films from polymer surfaces were 7.9 to 9.7 mJ/cm2, whereas the threshold fluence from a quartz surface was determined to be 17.8 mJ/cm2. For aluminum on top of quartz and aluminum coated polymers, higher threshold fluences were found compared to gold ranging from 12.96 to 22.7 mJ/cm2.Also, interfacial reactions between the polymer films and the metal layer occured and have been studied by SEM and XPS.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 304: Symposium H – Polymer/Inorganic Interfaces , 1993 , 103
Copyright
Copyright © Materials Research Society 1993

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References

[1] Bohandy, J., Kim, B.F.. Adrian, F.J., J. Appl. Phys. 60 1538 (1986)Google Scholar
[2] Fogarassy, E., Fuchs, C., J.Mat.Res. 4(5)1082 (1989)Google Scholar
[3] Baseman, R.J., Andreshak, J.C., Mat.Res.Soc.Symp.proc. 100 627 (1988) R.J. Baseman, Nan M.Froberg, J.C. Andreshak, Zack Schlesinger, Appl.Phys.Lett. 56(15),.1412 ,(1990)Google Scholar
[4] Handbook of chemistry and Physics. edited by Lide, David R., (71st Edition 1990–1991, CRC Press), 4–14, 5– 72, 12–87, 12–108.Google Scholar
[5] Handbook of Optical Constants of Solids, edited by Palik, Edward D., (1985, Academic Press), vol.1, Vol.2.Google Scholar
[6] Mittal, K.L., J.vac.Sci.Technol. 13(1), 19 (1976)Google Scholar