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Pressure-dependent DLTS Experiments on Si-DOPED AlGaAs
Published online by Cambridge University Press: 26 February 2011
Abstract
Pressure dependent Deep Level Transient Spectroscopy (DLTS) experiments are used to measure the properties of the deep donors (DX-centers) responsible for the persistent photoconductivity effect in Si-doped AlGaAs. The sample dependence of the DLTS spectra shows evidence for a defect complex involved in the DX-center.
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- Copyright © Materials Research Society 1988
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