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Preparation of Zeolites for TEM Using Microtomy

Published online by Cambridge University Press:  21 February 2011

Roseann Csencsits  and
Ronald Gronsky
Roseann Csencsits
Affiliation:
Center for Advanced Materials, Materials and Chemical Sciences Division, Lawrence Berkeley Laboratory, and Materials Science and Mineral Engineering Department, University of California, Berkeley, CA 94720
Ronald Gronsky
Affiliation:
Center for Advanced Materials, Materials and Chemical Sciences Division, Lawrence Berkeley Laboratory, and Materials Science and Mineral Engineering Department, University of California, Berkeley, CA 94720
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Abstract

The application of microtomy to Transmission Electron Microscopy (TEM) specimen preparation of zeolite catalysts is explained. Using a new acrylic resin (LR White®) thin sections (≤60 nm) may be cut with relative ease. Although the details described are specific to catalysts, microtomy and the use of the acrylic resin are applicable to any hard ceramic powder sample.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 115: Symposium W – Specimen Preparation for Transmission Electron Microscopy of Materials I , 1987 , 103
Copyright
Copyright © Materials Research Society 1988

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References

REFERENCES

[1] Reid, N., in Practical Methods in Electron Microscopy, V3, Ultramicrotomy, edited by Glauert, A.M., (Elsevier Science Publishers, New York, NY, 1975).Google Scholar
[2] Treacy, M.M.J. and Howie, A., J. Catal. 63, 265 (1980).Google Scholar
[3] Tucker, D.S., Jenkins, E.J. and Hren, J.J., J. Electr. Microsc. Tech. 2, 29 (1985).Google Scholar
[4] Csencsits, R., Schooley, C. and Gronsky, R., J. Electr. Microsc. Tech. 2, 643 (1985).Google Scholar
[5] Davis, D.B. and Dickman, M.C., J. Electr. Microsc. Tech. (in press).Google Scholar
[6] Murphy, J.A. and Price, R.L., Proc. 41st Annual EMSA Meeting, Phoenix, AZ, 1983, Ed. Bailey, G.W. (San Francisco Press, San Francisco, CA, 1983)pp. 624–625.Google Scholar