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Published online by Cambridge University Press: 15 February 2011
Polycrystalline Sn2P2S6 films were prepared by “hot wall” method and studied for possible electronic application. This paper deals with the determination of correlation between the preferred crystallite orientation of the film and its piezoelectric parameters. It is shown that is possible to optimize the piezoelectric properties of Sn2P2S6 films by prescribing the certainrelief of the substrate surface.