Hostname: page-component-586b7cd67f-2plfb Total loading time: 0 Render date: 2024-11-25T15:42:54.717Z Has data issue: false hasContentIssue false
  • English
  • Français

Preparation of Planview TEM Samples of Yba2Cu307−x Films Grown on BaF2(001)

Published online by Cambridge University Press:  21 February 2011

Yang Li ,
Zhang Jinlong ,
Fan Chenggao  and
Zhang Yuheng
Yang Li
Affiliation:
University of Science and Technology of China, Structure Research Laboratory, Auhui, Hefei, 230026, People's Republic of China.
Zhang Jinlong
Affiliation:
University of Science and Technology of China, Structure Research Laboratory, Auhui, Hefei, 230026, People's Republic of China.
Fan Chenggao
Affiliation:
University of Science and Technology of China, Structure Research Laboratory, Auhui, Hefei, 230026, People's Republic of China.
Zhang Yuheng
Affiliation:
University of Science and Technology of China, Structure Research Laboratory, Auhui, Hefei, 230026, People's Republic of China.
Get access

Abstract

A method for the preparation of planview transmission electron microscope (TEM) specimens of expitaxial Yba2Cu3O7−x (YBCO) thin films deposited on BaF2 by a dc modified planar magnetron sputtering technique is reported. The films are granular with their grains size ranging from a few hundred to a few thousand nanometers. The epitactic nature of the film growth is shown by analyses of moiré fringe patterns and by selected area diffraction methods. It is demonstrated that the YBCO thin film obtained is highly c-axis oriented, with misorientation corresponding to rotations of 9.2° and 90° about the c-axis. Additionally, the film's a or b axes form a 45° angle with that of the substrate.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 254: Symposium W – Specimen Preparation for Transmission Electron Microscopy of Materials III , 1991 , 149
Copyright
Copyright © Materials Research Society 1992

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

[1] See, for example, in the Proceeding of the SPIE Meeting, Santa Clara, CA, Oct. 1989, edited by Venkatesan, T., International Society for Optical Engineering. Bellingham, WA, (1989).Google Scholar
[2] Hsieh, Yong-Fen, et al., Appl. Phys. Lett. 57, 2268 (1990).CrossRefGoogle Scholar
[3] Ravi, T.S., et al. Phys. Rev. B42, 10141 (1990).CrossRefGoogle Scholar
[4] Xiong, G.C. and Wang, S.Z., Appl. Phys. Lett. 55, 902 (1989).Google Scholar
[5] Hirsh, P.B., et al., “Electron Microscopy of Thin Crystals,” Krieger, Robert E., Huntington, New York (1977).Google Scholar