Hostname: page-component-6bf8c574d5-m789k Total loading time: 0 Render date: 2025-03-09T14:20:21.694Z Has data issue: false hasContentIssue false
  • English
  • Français

Preparation of Nano-Sized Doped Ceria for SOFC Anodes

Published online by Cambridge University Press:  01 February 2011

Jumpei Kobayashi ,
Hitoshi Takamura ,
Atsunori Kamegawa  and
Masuo Okada
Jumpei Kobayashi
Affiliation:
[email protected], Tohoku Univ., Department of Materials Science, 6-6-02 Aramaki Aza Aoba, Sendai, Miyagi, 980-8579, Japan
Hitoshi Takamura
Affiliation:
[email protected], Japan
Atsunori Kamegawa
Affiliation:
[email protected], Japan
Masuo Okada
Affiliation:
[email protected], Japan
Get access

Abstract

Nano-particles of Pr and Mn-doped ceria have been prepared by mixing nitrate solutions and hexamethylenetetramine as an oxidizing agent, and their thermal stability has been investigated. The particle size was evaluated by means of XRD, BET and dynamic light scattering techniques. The particle size of Pr and Mn-doped ceria was found to be approximately 3 nm as prepared. Even though the particle size of doped ceria increases with increasing annealing temperature, the size of less than 15 nm was kept after annealing at 873 K for 10 h. On the other hand, the lattice constant of nano-sized ceria, for example 0.544 nm for 3 nm-size particles, decreases and reaches to the value of bulk material (0.541 nm) as annealing temperature increases. This suggests that the valence state of cerium and the amount of oxygen vacancies strongly depend on the particle size.

Keywords

ionic conductorceramicgrain size
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 885: Symposium A – The Hydrogen Cycle – Generation, Storage and Fuel Cells , 2005 , 0885-A03-08
Copyright
Copyright © Materials Research Society 2006

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Nauer, M., Ftikos, C. and Steele, B. C. H., J. Eur. Ceram. Soc. 14 493 (1994).Google Scholar
2. Ftikos, Ch., Carter, S. and Steele, B. C. H., J. Eur. Ceram. Soc. 12 267 (1993).Google Scholar
3. Takasu, Y., Sugino, T. and Matsuda, Y., Appl, J.. Electrochem. 14 79 (1984).Google Scholar
4. Takamura, H., Okumura, K., Koshino, Y., Kamegawa, A. and Okada, M., J. Electroceram. 13 613 (2003).Google Scholar
5. Maier, J., Prog. Solid State Chem. 23 171 (1995).Google Scholar
6. Chiang, Y. M., Lavik, E. B., Kosacki, I. and Tuller, H. L., J. Electroceram. 1 7 (1997).Google Scholar
7. Blazevic, N. and Kolbah, D., Synthesis 161 (1979).Google Scholar
8. Dreyfors, J. M., Jones, S. B., and Sayed, Y., Am. Ind. Hyg. Assoc. J. 50 579 (1989).Google Scholar
9. Klug, H. P. and Alexander, L. E., X-Ray Diffraction Procedures, (John Wiley & Sons, New York, 1974) p. 634.Google Scholar
10. He, J., Ye, J., Laverniaz, E. J., Matejczyk, D., Bampton, C. and Schoenung, J. M., J. Mater. Sci. 39 6957 (2004).Google Scholar
11. Zhang, Z., Zhou, F. and Lavernia, E. J., Metall. Mater. Trans. A 34 1349 (2003).Google Scholar
12. Chen, P. and Chen, I., J. Am. Ceram. Soc. 76 1577 (1993).Google Scholar
13. Tsunekawa, S., Sahara, R., Kawazoe, Y. and Ishikawa, K., Appl. Surf. Sci. 152 53 (1999).Google Scholar
14. Shannon, R.D., Acta Crystallogr. A32 751 (1976).Google Scholar