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Preparation of Electropolished Transverse Sections of Thin Aluminum Sheet for Transmission Electron Microscopy

Published online by Cambridge University Press:  21 February 2011

Steve Smith
Steve Smith*
Affiliation:
Aluminum Company of America, Alcoa Technical Center, Alcoa Center, PA 15069
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Abstract

The preparation of transverse section TEM foils from thin (0.2 mm to 1.5 mm) aluminum sheet would usually be accomplished by a combination of dimpling and ion milling. Both of these techniques are time consuming. A technique has been developed which allows these transverse section foils to be prepared by electropolishing, which greatly reduces the time required for specimen preparation. This technique also produces far more thin area for examination than a comparable foil which has been dimpled and ion milled, and eliminates artifacts produced by ion milling.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 115: Symposium W – Specimen Preparation for Transmission Electron Microscopy of Materials I , 1987 , 223
Copyright
Copyright © Materials Research Society 1988

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References

REFERENCES

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