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Preparation and Characterization of C60-Perdeuterated Styrene Copolymer Nanofilms

Published online by Cambridge University Press:  17 March 2011

Zhang Lin ,
Du Kai ,
Zhang Houqiong ,
Fan Yongheng ,
Tu Haiyan  and
Luo Xuan
Zhang Lin
Affiliation:
Institute of Nuclear Physics and Chemistry, CAEP, P.O.Box 919-987, 621900, Mianyang, P.R., China
Du Kai
Affiliation:
Institute of Nuclear Physics and Chemistry, CAEP, P.O.Box 919-987, 621900, Mianyang, P.R., China
Zhang Houqiong
Affiliation:
Institute of Nuclear Physics and Chemistry, CAEP, P.O.Box 919-987, 621900, Mianyang, P.R., China
Fan Yongheng
Affiliation:
Institute of Nuclear Physics and Chemistry, CAEP, P.O.Box 919-987, 621900, Mianyang, P.R., China
Tu Haiyan
Affiliation:
Institute of Nuclear Physics and Chemistry, CAEP, P.O.Box 919-987, 621900, Mianyang, P.R., China
Luo Xuan
Affiliation:
Institute of Nuclear Physics and Chemistry, CAEP, P.O.Box 919-987, 621900, Mianyang, P.R., China
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Abstract

C60-Perdeuterated Styrene Copolymer (C60-DPS) was synthesized by the free radical polymerization. Thin films of C60-DPS were prepared by the Langmuir-Boldgett (LB) technique. The surface morphology and friction performance were characterized by atomic force microscopy (AFM). Results exhibit the presence of spherical granules in the compact LB films, which result from self-polymerization of C60 and showed friction of the LB films increased basically as C60 content of C60-DPS decreased.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 710: Symposia DD – Polymer Interfaces and Thin Films , 2001 , DD6.6.1
Copyright
Copyright © Materials Research Society 2002

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References

1. Aerle, N.A.J.M. van, Barmentlo, M., and Hollering, R.W.J., J. Appl. Phys. 74 (5), 3111–3120(1993)Google Scholar
2. Forrest, J.A., Dalnoki-Veress, K., Stevens, J.R., and Dutcher, J.R., Phys. Rev. Letters, 77(10), 2002–2005(1996)Google Scholar
3. Wang, L.Y., Xi, S.Q., Thin Film Sci. and Tech. 7(3), 261–263(1994)Google Scholar
4. Shi, B., Wang, J.H., Qian, L.M., Huang, L., and Hong, H., Chinese J.Mater.Research, 346–350(1997)Google Scholar