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Preferred Orientations for Sol-Gel Derived Plzt Thin Layers

Published online by Cambridge University Press:  21 February 2011

Toshihiko Tani ,
Zhengkui Xu  and
David A. Payne
Toshihiko Tani
Affiliation:
Department of Materials Science and Engineering, Matmeials Research Laboratory and Beckman Institute, University of Illinois at Urbana-Champaign, Urbana, IL 61801
Zhengkui Xu
Affiliation:
Department of Materials Science and Engineering, Matmeials Research Laboratory and Beckman Institute, University of Illinois at Urbana-Champaign, Urbana, IL 61801
David A. Payne
Affiliation:
Department of Materials Science and Engineering, Matmeials Research Laboratory and Beckman Institute, University of Illinois at Urbana-Champaign, Urbana, IL 61801
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Abstract

PLZT thin layers were deposited onto various substrates by sol-gel methods, and crystallized under different conditions and substrate treatments. Relationships are given for the chemical characteristics of the substrate's surface and the preferred orientations which develop on heat treatment. A preferred (111) orientation always developed for perovskite crystallized on Pt layers which contained Ti on the surface. This was attributed to the formation of Pt3Ti and the role of heteroepitaxial nucleation and growth sites. In addition, a preferred (100) orientation was also obtained on unannealed Pt/Ti/SiO2/Si substrates which were free of Ti on the surface. This was attributed to self-textured growth with flat faces striving for minimum surface energy conditions. The results are discussed in terms of the importance of interfacial chemistry on the control of texture for crystallization of PLZT thin layers on coated substrates.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 310: Symposium N – Ferroelectric Thin Films III , 1993 , 269
Copyright
Copyright © Materials Research Society 1993

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