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Precipitation of Ar, Kr and Xe in Ni at Room Temperaturey*

Published online by Cambridge University Press:  25 February 2011

A. S. Liu  and
R. C. Birtcher
A. S. Liu
Affiliation:
Materials Science Division, Argonne National Laboratory, Argonne, IL 60439
R. C. Birtcher
Affiliation:
Materials Science Division, Argonne National Laboratory, Argonne, IL 60439
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Abstract

Transmission electron microscopy (TEM) has been used to study the precipitation of inert gases (Ar, Kr and Xe) injected into Ni at room temperature. The nucleation and size distribution of precipitates were found to be insensitive to the type of inert gas atom but dependent on gas concentration (ion fluence). The precipitate density decreases and the sizes increases with increasing gas concentration. In all cases, the inert gases precipitate as solid fcc crystals with their axes aligned with those of the host Ni lattice. For the same inert gas concentration, the lattice parameter is larger for the higher atomic mass in accord with bulk results. The lattice parameter of each type of inert gas precipitate increases with increasing gas concentration owing to the pressure relaxation that accompanies precipitate growth. This results in melting of large precipitates in accord with the behavior of bulk quantities of the gases at low temperatures.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 128: Symposium A – Processing and Characterization of Materials Using Ion Beams , 1988 , 303
Copyright
Copyright © Materials Research Society 1989

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Footnotes

*

Work supported by the U. S. Department of Energy, BES-Materials Sciences, under Contract W-31-109-Eng-38.

References

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