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Published online by Cambridge University Press: 28 February 2011
We present here experimental results using transmission electron microscopy (TEM) and real time video recordings, of the many dynamic structural instabilities in amorphous silica structures during intense electron beam irradiation. It is observed that while the silica layers on oxidized silicon particles sinter when irradiated uniformly, they undergo necking and extensive plastic deformation when the beam is focused in the neck regions. Extremely thin silica fibers (less than five nanometers in diameter and microns in length) can be produced by the deformation of such necks between particles. The thin fibers and the sharp tips developed from the failure of such structures are seen to spheroidize and blunt when exposed to the electron beam. The instabilities are thought to arise from irradiation induced charging of the insulator surface which expands to reduce the density of accumulated surface charges.