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Piezoresponse Force Microscopy Characterization of PTO Thin Films

Published online by Cambridge University Press:  31 January 2011

Alessio Morelli
Affiliation:
[email protected], Zernike Institute for Advanced Materials, Applied Physics, Groningen, Netherlands
Sriram Venkatesan
Affiliation:
[email protected], Zernike Institute for Advanced Materials, Applied Physics, Groningen, Netherlands
George Palasantzas
Affiliation:
[email protected], Zernike Institute for Advanced Materials, Applied Physics, Groningen, Netherlands
Bart J. Kooi
Affiliation:
[email protected], Zernike Institute for Advanced Materials, Applied Physics, Groningen, Netherlands
Jeff De Hosson
Affiliation:
[email protected], Zernike Institute for Advanced Materials, Applied Physics, Groningen, Netherlands
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Abstract

The piezoelectric properties of PTO thin films grown by pulsed laser deposition are investigated with piezoresponse force microscopy and transmission electron microscopy. The as-grown films exhibit upward polarization, and inhomogeneous distribution of piezoelectric characteristics. The data obtained reveal imprint during piezoresponse force microscopy measurements, nonlinearity in the piezoelectric deformation, and limited retention loss. Moreover, transmission electron microscopy shows the presence of defects near the film/substrate interface, which can be associated with the variations of piezoelectric properties.

Type
Research Article
Copyright
Copyright © Materials Research Society 2009

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