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Piezoelectric Level Splitting in GaInN/GaN Quantum Wells

Published online by Cambridge University Press:  15 February 2011

C. Wetzel
Affiliation:
High Tech Research Center and Department of Electrical and Electronic Engineering, Meijo University, 1-501 Shiogamaguchi, Tempaku-ku, Nagoya 468-8502, Japan
T. Takeuchi
Affiliation:
High Tech Research Center and Department of Electrical and Electronic Engineering, Meijo University, 1-501 Shiogamaguchi, Tempaku-ku, Nagoya 468-8502, Japan
H. Amano
Affiliation:
High Tech Research Center and Department of Electrical and Electronic Engineering, Meijo University, 1-501 Shiogamaguchi, Tempaku-ku, Nagoya 468-8502, Japan
I. Akasaki
Affiliation:
High Tech Research Center and Department of Electrical and Electronic Engineering, Meijo University, 1-501 Shiogamaguchi, Tempaku-ku, Nagoya 468-8502, Japan
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Abstract

Identification of the electronic band structure in AlInGaN heterostructures is the key issue in high performance light emitter and switching devices. In device-typical GaInN/GaN multiple quantum well samples in a large set of variable composition a clear correspondence of transitions in photo- and electroreflection, as well as photoluminescence is found. The effective band offset across the GaN/GaInN/GaN piezoelectric heterointerface is identified and electric fields from 0.23 - 0.90 MV/cm are directly derived. In the bias voltage dependence a level splitting within the well is observed accompanied by the quantum confined Stark effect. We furthermore find direct correspondence of luminescence bands with reflectance features. This indicates the dominating role of piezoelectric fields in the bandstructure of such typical strained layers.

Type
Research Article
Copyright
Copyright © Materials Research Society 1999

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References

1 Takeuchi, T., Takeuchi, H., Sota, S., Sakai, H., Amano, H., and Akasaki, I., Jpn. J. Appl. Phys. 36, L177 (1997).Google Scholar
2 Akasaki, I. and Amano, H., Jpn. J. Appl. Phys. 36, 5393 (1997).Google Scholar
3 Wetzel, C., Amano, H., Akasaki, I., Suski, T., Ager, J.W., Weber, E.R., Hailer, E.E., and Meyer, B.K., Nitride Semiconductors, Proc. Mater. Res. Soc. 482, 489 (1998).Google Scholar
4 Wetzel, C., Takeuchi, T., Yamaguchi, S., Katoh, H., Amano, H., and Akasaki, I., Appl. Phys. Lett. 73, 1994 (1998).Google Scholar
5 Wetzel, C., Nitta, S., Takeuchi, T., Yamaguchi, S., Amano, H., and Akasaki, I., MRS Internet J. Nitride Semicond. Res. 3, 31 (1998). No warranty! http://nsr.mij.mrs.org/3/31/Default.htmlGoogle Scholar
6 Takeuchi, T., Wetzel, C., Yamaguchi, S., Sakai, H., Amano, H., Akasaki, I., Kaneko, Y., Nakagawa, S., Yamaoka, Y., and Yamada, N., Appl. Phys. Lett. 73, 1691 (1998).Google Scholar
7 Hangleiter, A., Im, J.S., Kollmer, H., Heppel, S., Off, J., Scholz, F., MRS Internet J. Nitride Semicond. Res. 3, 15 (1998).Google Scholar
8 Bykhovski, A.D., Kaminski, V.V., Shur, S., Chen, Q.C., and Khan, M.A., Appl. Phys. Lett. 68, 818 (1996).Google Scholar
9 Bernardini, F., Fiorentini, V., and Vanderbilt, D., Phys. Rev. Lett. 79, 3958 (1997).Google Scholar
10 Shur, S. in Compound Semiconductors Spring I (1998) p. 12 Google Scholar
11 Chichibua, S., Azuhata, T., Sota, T., and Nakamura, S., Appl. Phys. Lett. 69, 4188 (1996).Google Scholar
12 Denecke, R., Morais, J., Wetzel, C., Liesegang, J., Haller, E.E., Fadley, C.S., Proc. Mater. Res. Soc. 468, 263 (1997).Google Scholar
13 Aspnes, D.E., Phys. Rev. B 10, 4228 (1974); Phys. Rev. 153, 972 (1967).Google Scholar
14 Wetzel, C., Takeuchi, T., Yamaguchi, S., Katoh, H., Amano, H., and Akasaki, I., Proc. 2nd Int. Symp. Blue Laser & Light Emitting Diodes, Kisarazu, Chiba, Japan, 1998. p.646–9.Google Scholar
15 Wetzel, C., Takeuchi, T., Kato, H., Amano, H., and Akasaki, I., Proc. 24th Int. Conf. on the Physics of Semiconductors, Jerusalem, Israel, August 2-8, 1998. in print. Google Scholar