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Picosecond Time-Resolved Amorphization Velocities in Silicon

Published online by Cambridge University Press:  26 February 2011

C.A. Macdonald  and
B.E. Homan
C.A. Macdonald
Affiliation:
Physics Department, University at Albany, SUNY, Albany, NY 12222
B.E. Homan
Affiliation:
Physics Department, University at Albany, SUNY, Albany, NY 12222
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Abstract

Transient time-resolved picosecond reflectivity measurements were performed on silicon melted by a 40 ps ultraviolet (308 nm) beam. These were compared to simulations of reflectivity versus amorphous and liquid layer depth and of amorphous interface velocity for various models including transition state theory and density limited growth, both with and without thermal activation.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 205: Symposium F – Kinetics of Phase Transformations , 1990 , 99
Copyright
Copyright © Materials Research Society 1992

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