Hostname: page-component-78c5997874-4rdpn Total loading time: 0 Render date: 2024-11-16T20:19:57.054Z Has data issue: false hasContentIssue false
  • English
  • Français

Photoinduced Noise in Amorphous Semiconductor Films

Published online by Cambridge University Press:  25 February 2011

F. Demichelis ,
C.F. Pirri  and
A. Tagliaferro
F. Demichelis
Affiliation:
Dipartimento di Fisica - Politecnico - Torino
C.F. Pirri
Affiliation:
Dipartimento di Fisica - Politecnico - Torino
A. Tagliaferro
Affiliation:
Dipartimento di Fisica - Politecnico - Torino
Get access

Abstract

Electrical noise measurements have been performed on amorphous semiconductor films under irradiation with monochromatic light at different wavelengths. The Power Spectrum Densities (PSDs) of highly photoconductive undoped a-Si:H and a-SiC:H (deposited by glow discharge) in the frequency range .1 – 20 kHz are obtained at room temperature. The analysis is performed upon metal/semiconductor/ITO Schottky barriers. The PSDs vs frequency follow l/fn law and show a change of magnitude when the wavelength of the incident light is varied around the value corresponding to the energy gap.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 192: Symposium O – Amorphous Silicon Technology - 1990 , 1990 , 341
Copyright
Copyright © Materials Research Society 1990

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

Carbone, A., Demichelis, F. and Mazzetti, P., Mat. Res. Soc. Symp. Proc. vol.152, p.163 (1989).Google Scholar
2. Carbone, A., Demichelis, F. and Mazzetti, P., Proc. of “Noise in Physical System”, Budapest 1989.Google Scholar
3. Anderson, J.C., Phil. Mag. B 48, 31 (1983).Google Scholar
4. D’Amico, A., Fortunato, G. and VanVliet, CM., Journ. of Non-Cryst. Sol. 77/78, 499 (1985).Google Scholar
5. Bathaei, F.Z. and Anderson, J.C., Phil. Mag. B 55, 87 (1987).Google Scholar