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Photo-Hall, Pr, Pl and Photoconductivity Study On Native Defects in CuInS2
Published online by Cambridge University Press: 22 February 2011
Abstract
By correlating the results of photoreflectance, photoconductivity, photoluminescence, and differential-Hall and photo-Hall measurements with the stoichiometry, for a number of undoped single crystal samples, we could conclude two donor levels (35 meV, 70 meV) and three acceptor levels (100 meV, 155 meV, 170 meV) distributed in the forbidden ga.p for undoped CuInS2 samples.
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- Copyright © Materials Research Society 1992
References
REFERENCES
]1]
Hsu, Y.J., Yang, M.H., Tang, R.S., Hsu, T.M. and Hwang, H.L., Cryst. Growth
20, 83 (1984)Google Scholar
[4]
Gonzalez, J., Torreo, J.A. and Perez, G.S., Phys. Stat. Sol. (a) 69, K37 (1982)CrossRefGoogle Scholar
[6]
Bhattachaarya, R.N., Shen, H., Parayanthal, P. and Pollak, F.H., Phys. Rev. B
37, 4044 (1988)Google Scholar
[7]
Verheijen, A.W., Giling, L.J. and Bloem, J., J. Mater. Res. Bull.
14, 237 (1979)CrossRefGoogle Scholar
[9]
LShay, J. and Wernick, J.H., Ternary Chalcopyrite Semiconductors: Growth, Electronic Properties, and Applications, Pergamon Press, New York, p.4, 12,118, 1975
Google Scholar
[10]
Mora, S., Romeo, N. and Tarricone, L., Solid State Commun.
29, 155 (1979)CrossRefGoogle Scholar
[15]
Horig, V., Kuhn, G., Moller, W., Muller, A., Neumann, H. and Reccius, E., Kristall und Teclnik
14, 229 (1979)Google Scholar
[16]
Mandel, L., Tomlinson, R.D., Hamnpshire, M.J. and Neumann, H., Solid state commun.
32, 201 (1979)CrossRefGoogle Scholar
[24]
Lange, P., Neff, H., Fearheiley, M.L. and Bachmann, J., Electronic Materials
14, 6 (1985)Google Scholar