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Photoemission Results for Laser-Annealed Si(111) and Ge(111) Surfaces

Published online by Cambridge University Press:  15 February 2011

F.J. Himpsel
Affiliation:
IBM T.J. Watson Research Center, Yorktown Heights, NY 10598, USA
D.E. Eastman
Affiliation:
IBM T.J. Watson Research Center, Yorktown Heights, NY 10598, USA
B. Reihl
Affiliation:
IBM T.J. Watson Research Center, Yorktown Heights, NY 10598, USA
C.W. White
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, TN 37830, USA
D.M. Zehner
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, TN 37830, USA
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Abstract

We have studied the valence band and surface-core-level states for laser-annealed, thermally-annealed, and cleaved Ge(111) and Si(l11) surfaces with high resolution photoelectronspectroscopy using synchrotron radiation. For the annealed surfaces we find two surface states near the top of the valence band as well as characteristic surface core level spectra. These indicate the existence of a common local bonding geometry for all these surfaces. We observe that the (1 × 1) and cleaved (2 × 1) surfaces are not related as recently reported for Si.

Type
Research Article
Copyright
Copyright © Materials Research Society 1982

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References

REFERENCES

1. Chadi, D.J. and Chiang, C., Phys. Rev. B 23, 1843 (1981).Google Scholar
2. Chadi, D.J. et al. , Phys. Rev. Lett. 44, 799 (1980).Google Scholar
3. Phillips, J.C., Phys. Rev. Lett. 45, 905 (1980).Google Scholar
4. Lander, J.J. and Morrison, J., J. Appl. Phys. 34, 1403 (1963).Google Scholar
5. Murotani, T., Fujiwara, K. and Nishijima, N., Phys. Rev. B 12, 2424 (1975).Google Scholar
6. Guichar, G.M., Garry, G.A. and Sebenne, C.A., Surf. Sci. 85, 326 (1979).Google Scholar
7. Erbudak, M. and Fischer, T.E., Phys. Rev. Lett. 29, 732 (1972).Google Scholar
8. Rowe, J.E. and Ibach, H., Phys. Rev. Lett. 32, 421 (1974).CrossRefGoogle Scholar
9. Eastman, D.E., Himpsel, F.J., Knapp, J.A. and Pandey, K.C., Physics of Semiconductors 1978, Inst. Phys. Conf. Ser.43, 1059 (1979).Google Scholar
10. Hansson, G.V., Uhrberg, R.I.G., Flodstrom, S.A., Surf. Sci. 89, 159 (1979).Google Scholar
11. Houzay, F., Guichar, G.M., Pinchaux, R., Thiry, P., Petroff, Y. and Dagneaux, D., Surf. Sci. 99, 28 (1980).Google Scholar
12. Himpsel, F.J., Heimann, P., Chiang, T.-C. and Eastman, D.E., Phys. Rev. Lett. 45, 1112 (1980).CrossRefGoogle Scholar
13. Yokotsuka, T., Kono, S., Suzuki, S. and Sagawa, T., Solid State Commun. 39, 1001 (1981).Google Scholar
14. McKinley, A., Parke, A.W., Hughes, G.J., Fryar, J., Williams, R.H. J. Phys. D. 13, L193 (1980).CrossRefGoogle Scholar
15. Chabal, Y.J., Rowe, J.E. and Zwemer, O.A., Phys. Rev. Lett. 46, 600 (1981).Google Scholar
16. Himpsel, F.J., Eastman, D.E., Heimann, P., Reihl, B., White, C.W. and Zehner, D.M., Phys. Rev. B 24, 1120 (1981).Google Scholar
17. Zehner, D.M., White, C.W., Heimann, P., Reihl, B., Himpsel, F.J. and Eastman, D.E., Phys. Rev. B 24, 4875 (1981).Google Scholar
18. Himpsel, F.J., Heimann, P., Eastman, D.E., Phys. Rev. B 24, 2003 (1981).CrossRefGoogle Scholar
19. Eastman, D.E., Donelon, J.J., Hien, N.C., Himpsel, F.J., Nucl. Instr. Methods 172, 327 (1980).Google Scholar
20. Zehner, D.M., White, C.W. and Ownby, G.W., Appl. Phys. Lett. 37, 456 (1980).Google Scholar
21. Estimated from GaAs data in Eastman, D.E., Chiang, T.-C., Heimann, P. and Himpsel, F.J., Phys. Rev. Lett. 45, 656 (1980).Google Scholar
22. Zehner, D.M., Noonan, J.R., Davis, H.L. and White, C.W., J. Vac. Sci. and Technol. 18, 852 (1981).Google Scholar
23. Redondo, A., Goddard III, W.A. and McGill, T.C., Himpsel, F.J. and Eastman, D.E., to be published.Google Scholar
24. Del Sole, R. and Chadi, D.J., to be published.Google Scholar
25. Duke, C.B. and Ford, W.K., to be published.Google Scholar