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Photoemission Measurements Of Photocathode Materials In The 115–400 Å Range

Published online by Cambridge University Press:  15 February 2011

S. Grantham ,
M.C. Richardson ,
R. Watts ,
T. Lucatorto ,
C. Tarrio  and
F. Pollack
S. Grantham
Affiliation:
Center for Research in Electro-Optics and Lasers, University of Central Florida, Orlando, FL
M.C. Richardson
Affiliation:
Center for Research in Electro-Optics and Lasers, University of Central Florida, Orlando, FL
R. Watts
Affiliation:
Physics Department, National Institute of Standards and Technology, Gaithersburg, MD.
T. Lucatorto
Affiliation:
Physics Department, National Institute of Standards and Technology, Gaithersburg, MD.
C. Tarrio
Affiliation:
Physics Department, National Institute of Standards and Technology, Gaithersburg, MD.
F. Pollack
Affiliation:
Physics Department, National Institute of Standards and Technology, Gaithersburg, MD.
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Abstract

With the intent of finding a sensitive photocathode material in the 130 Å (100eV) X-ray range for use in a high resolution soft X-ray Conversion Microscope, photoelectron yields of several materials (mostly alkali halides), were measured at the National Institute of Standards and Technology's (NIST) Synchrotron Ultraviolet Radiation Facility II (SURF II). These measurements were made as a function of wavelength in the spectral range 115 Å-400 Å. The measured values are comparable to previous measurements of the photoelectron yields of these and similar materials, and to an existing model of photoemission [1–3]. We also determined the effects of prolonged exposure to X-ray light on performance. Moreover, because of the hygroscopic nature of Alkali Iodides, measurements of the photoelectron yield versus wavelength were repeated for samples of CsI that were kept in storage for periods of time to determine the effects of storage time and water absorption on the photoelectron yield.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 306: Symposium K – Materials Aspects of X-Ray Lithography , 1993 , 181
Copyright
Copyright © Materials Research Society 1993

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References

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