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Photoemission Characterization of Thin Film Nucleation on Inert Substrates

Published online by Cambridge University Press:  25 February 2011

G. Haugstad ,
A. Raisanen ,
C. Caprile ,
X. Yu  and
A. Franciosi
G. Haugstad
Affiliation:
Department of Chemical Engineering and Materials Science, University of Minnesota, Minneapolis, MN 55455
A. Raisanen
Affiliation:
Department of Chemical Engineering and Materials Science, University of Minnesota, Minneapolis, MN 55455
C. Caprile
Affiliation:
Department of Chemical Engineering and Materials Science, University of Minnesota, Minneapolis, MN 55455
X. Yu
Affiliation:
Department of Chemical Engineering and Materials Science, University of Minnesota, Minneapolis, MN 55455
A. Franciosi
Affiliation:
Department of Chemical Engineering and Materials Science, University of Minnesota, Minneapolis, MN 55455
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Abstract

Synchrotron radiation photoemission was used to characterize Sm and Mn thin film nucleation and growth on solid Xe substrates, in the 3×1014 - 2×1016 atoms/cm2 coverage range. Film growth is well approximated by a model in which the nucleation site density remains constant and hemi-ellipsoidal particles increase in size until coalescence is achieved. Site density and average cluster size are determined from the coverage-dependence of metal and Xe photoemission intensities. Size estimates are confirmed by experimental fingerprints of coalescence.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 159: Symposium C – Atomic Scale Structure of Interfaces , 1989 , 51
Copyright
Copyright © Materials Research Society 1990

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References

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