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Photodetector Using Surface-Plasmon Antenna for Optical Interconnect

Published online by Cambridge University Press:  01 February 2011

Keishi Ohashi  and
Junichi Fujikata
Keishi Ohashi
Affiliation:
[email protected], NEC Corporation, Nano Electronics Res. Labs., Tsukuba, Japan
Junichi Fujikata
Affiliation:
[email protected], NEC Corporation, Nano Electronics Res. Labs., Tsukuba, Japan
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Abstract

We used a surface-plasmon antenna to obtain small photodetectors for LSI on-chip optical interconnection by using near-field light generated by the antenna. Such near-field devices are not constrained by the diffraction limit and they offer an approach to integrated nanoscale photonic devices. A small semiconductor structure is located near the antenna to absorb the near-field light. This structure can be made as small as the Schottky depletion layer, so the separation between electrodes can be reduced to almost the size of the near-field region. We have demonstrated a “Si nano-photodiode” or plasmon photodiode that uses the near-field localized in a subwavelength region, which is usually relatively large in size because of the long absorption length for Si (˜10 μm at a wavelength of ˜800 nm). The Si nano-photodiode has a fast impulse response with a full-width at half-maximum of ˜20 ps even when the bias voltage is small (˜1 V or less). We demonstrated an on-chip optical interconnect chip to operate circuitry in an LSI chip by using waveguide-coupled Si nano-photodiodes.

Keywords

AgoptoelectronicSi
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 1145: Symposium MM – Application of Group IV Semiconductor Nanostructures , 2008 , 1145-MM01-05
Copyright
Copyright © Materials Research Society 2009

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References

REFERENCES

1. Novotony, L. and Hecht, B., Principles of Nano-Optics, Cambridge University Press, New York (2006).Google Scholar
2. Raether, H., Surface Plasmons on Smooth and Rough Surfaces and on Gratings, Springer-Verlag, Berlin Heidelberg (1988).Google Scholar
3. Zia, R., Shuller, J. A., Chandran, A., and Brongersma, M. L., Materialstoday, 9, 20 (2006).Google Scholar
4. Genet, C. and Ebbesen, T. W., Nature, 445, 39 (2007).Google Scholar
5. Ohashi, K., Nishi, K., Shimizu, T., Nakada, M., Fujikata, J., Ushida, J., Gomyo, A., Ishi, T., Nose, K., Mizuno, M., Kinoshita, M., Suzuki, N., Okamoto, D., Yukawa, H., Tsuchizawa, T., Watanabe, T., Yamada, K., Itabashi, S., Akedo, J., IEDM 2007, 30.6.Google Scholar
6. Thio, T., Pellerin, K. M., Linke, R. A., Lezec, H. J., and Ebbesen, T. W., Opt. Lett,. 26, 1972 (2001).Google Scholar
7. Ishi, T., Fujikata, J., Makita, K., Baba, T., and Ohashi, K., Jpn. J. Appl. Phys., 44, L364, 2005.Google Scholar
8. Fujikata, J., Ishi, T., Okamoto, D., Nishi, K., and Ohashi, K., LEOS 2006, WF2.Google Scholar
9. Ebbesen, T. W., Lezec, H. J., Ghaemi, H. F., Thio, T., and Wolff, P. A., Nature, 391, 667 (1998).Google Scholar
10. Ishihara, K. and Ohashi, K., Jpn. J. Appl. Phys., 44, L 973, 2005.Google Scholar
11. Nahata, A., Linke, R. A., Ishi, T., and Ohashi, K., Opt. Let., 28, 423, 2003.Google Scholar
12. Okamoto, D., Fujikata, J., Nishi, K., and Ohashi, K., Jpn. J. Appl. Phys., 47, 2921 (2008).Google Scholar
13. Crouse, D., IEEE Trans. Electron Devices, 52, 2365 (2005).Google Scholar
14. Fujikata, J., Nose, K., Ushida, J., Nishi, K., Kinoshita, M., Shimizu, T., Ueno, T., Okamoto, D., Gomyo, A., Mizuno, M., Tsuchizawa, T., Watanabe, T., Yamada, K., and Ohashi, K., Appl. Phys. Exp., 1, 022001, 2008.Google Scholar
15. Shimizu, T., Kinoshita, M., Ueno, T., Fujikata, J., Furue, K., Nishi, K., Ohashi, K., ICEP 2008, 12B3–3.Google Scholar
16. Ohashi, K., Fujikata, J., Ishi, T., Nishi, K., Ishihara, K., Mizuno, M., Nose, K., and Baba, T., GFP 2006, ThA3.Google Scholar
17. Tang, L., Miller, D. A. B., Okyay, A. K., Matteo, J. A., Yuen, Y., Saraswat, K. C., and Hesselink, L., Opt. Lett., 31, 1519 (2006).Google Scholar
18. Schaadt, D. M., Feng, B., and Yu, E. T., Appl. Phys. Lett. 86, 063106 (2005).Google Scholar