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Photocurrent Profile in a-SiC:H Monolithic Tandem Pinpin and Pinip Photodiodes

Published online by Cambridge University Press:  01 February 2011

Alessandro Fantoni ,
Manuela Vieira  and
Yuri Vygranenko
Alessandro Fantoni
Affiliation:
[email protected], ISEL, DEETC, Rua Conselheiro Emidio Navarro, Lisbon, 1949-014, Portugal
Manuela Vieira
Affiliation:
[email protected], ISEL, DEETC, Rua Conselheiro Emidio Navarro, Lisbon, 1949-014, Portugal, +351218317290, +351218317114
Yuri Vygranenko
Affiliation:
[email protected], ISEL, DEETC, Rua Conselheiro Emidio Navarro, Lisbon, 1949-014, Portugal
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Abstract

We present in this paper results about the analysis of photocurrent and spectral response in a-SiC:H/ a-Si:H pinpin and pinip structures. Our experiments and analysis reveal the photocurrent profile to have a strong nonlinear dependence on the externally applied bias and on the light absorption profile, i.e. on the incident light wavelength and intensity. Our interpretation points out the cause of such effect to a self biasing of the junctions under certain unbalanced light generation of carriers and to an asymmetric reaction of the internal electric fields to the externally imposed bias. The possibility to relate such a behavior to the light intensity and wavelength indicates realistic hypothesis of using these structures and this effect for color recognition sensors.

We present results about the experimental characterization of the structures and numerical simulations obtained with the program ASCA. Considerations about electrical field profiles and inversion layers will be taken into account to explain the optical and voltage bias dependence of the spectral response. Our results show that in both structures the application of an external electrical bias (forward or reverse) mainly influences the field distribution within the less photo excited sub-cell.

Keywords

simulationsensoramorphous
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 989: Symposium A – Amorphous and Polycrystalline Thin-Film Silicon Science and Technology-2007 , 2007 , 0989-A18-12
Copyright
Copyright © Materials Research Society 2007

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