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Phonon Spectra Dependence on Growth and Sample Treatment in β-FeSi2

Published online by Cambridge University Press:  03 September 2012

G. Guizzetti ,
F. Marabelli ,
M. Patrini ,
Y. Mo ,
N. Onda  and
H. Von KÄnel
G. Guizzetti
Affiliation:
Dipartimento di Fisica “A.Volta”, Universiti di Pavia, Via Bassi 6, 1-27100 Pavia, Italy
F. Marabelli
Affiliation:
Dipartimento di Fisica “A.Volta”, Universiti di Pavia, Via Bassi 6, 1-27100 Pavia, Italy
M. Patrini
Affiliation:
Dipartimento di Fisica “A.Volta”, Universiti di Pavia, Via Bassi 6, 1-27100 Pavia, Italy
Y. Mo
Affiliation:
Laboratorium für Festkörperphysik, Swiss Federal Institute of Technology (ETH), CH-8093 Zürich, Switzerland
N. Onda
Affiliation:
Laboratorium für Festkörperphysik, Swiss Federal Institute of Technology (ETH), CH-8093 Zürich, Switzerland
H. Von KÄnel
Affiliation:
Laboratorium für Festkörperphysik, Swiss Federal Institute of Technology (ETH), CH-8093 Zürich, Switzerland
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Abstract

Transmittance, reflectance and Raman measurements have been performed from 50 to 700 cm−1 on different thin films of β-FeSi2 epitaxially grown by MBE on Si substrates. Vibrational spectra show much more structures than the five phonons usually observed in this material; the dependence on the crystalline orientation, the thickness, the growth and the annealing temperature has been studied.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 320: Symposium D – Silicides, Germanides, and Their Interfaces , 1993 , 127
Copyright
Copyright © Materials Research Society 1994

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References

REFERENCES

[1] Bost, M.C. and Mahan, J.E., J. Appl. Phys. 58, 2696 (1985); ibid. 64, 2034 (1988).CrossRefGoogle Scholar
[2] Dusausoy, Y., Protas, J., Wandji, R. and Roques, B., Acta Cristallogr. B27, 1029 (1971).Google Scholar
[3] Cherief, N., d'Anterroches, C., Cinti, R.C., Nguyen, T.A., and Derrien, J., Appl. Phys. Lett. 55, 1671 (1989).CrossRefGoogle Scholar
[4] Mahan, J.E., Geib, K.M., Robinson, G.Y., Long, R.G., Xinghua, Y., Bai, G., Nicolet, M.A., and Nathan, M., Appl. Phys. Lett. 56, 2126 (1990).CrossRefGoogle Scholar
[5] Lefki, K., Muret, P., Cherief, N., and Cinti, R.C., J. Appl. Phys. 69, 352 (1991).CrossRefGoogle Scholar
[6] Rizzi, A., Moritz, H., and Liith, H., J. Vac. Sci. Technol. A9, 912 (1991).CrossRefGoogle Scholar
[7] Lagomarsino, S., Scarinci, F., Savelli, G., Giannini, C., Castrucci, P., and Grimaldi, M.G., J. Appl. Phys. 71, 1224 (1992).CrossRefGoogle Scholar
[8] Shifer, H. Ch., Rèsen, B., Moritz, H., Rizzi, A., Lengeler, B., and Liith, H., Appl. Phys. Lett. 62, 2271 (1993).CrossRefGoogle Scholar
[9] Sirringhaus, H., Onda, N., Miiller-Gubler, E., Mfiller, P., Stalder, R., and Kiinel, H. von, Phys. Rev. B 47, 10567 (1993).CrossRefGoogle Scholar
[10] Mueller, E., Deller, H.R., Nissen, H.-U. and Kaenel, H. von 26. Kolloquium des Arbeitskreises fuer Elektronenmikroskopische Direkt- abbildung und Analyse von Oberflaechen, Zuerich, 1993 (in press); and references therein.Google Scholar
[11] Birkholz, U., Finkenrath, H., Naegele, J., and Uhle, N., Phys. Stat. Sol. 30, K81 (1968).CrossRefGoogle Scholar
[12] Lefki, K., Muret, P., Bustarret, E., Boutarek, N., Madar, R., Chevrier, J., Derrien, J., and Brunel, M., Sol. State Commun. 80, 791 (1991).CrossRefGoogle Scholar
[13] Borghesi, A., Piaggi, A., Stella, A., Guizzetti, G., Nava, F., and Santoro, G., Proc. 20th ICPS, ed. by Anastassakis, E.M. and Joannopoulos, J.D. (Word Sci., Singapore, 1991) p. 2001.Google Scholar
[14] Kotini, S., Siapkas, D.I., and Dimitriadis, C.A., Proc. 20th ICPS, ed. by Anastassakis, E.M. and Joannopoulos, J.D. (Word Sci., Singapore, 1991) p. 316.Google Scholar
[15] Henrion, W., Lange, H., Jahne, E. and Giehler, M., Appl. Surf. Sci. 70/71, 569 (1993).CrossRefGoogle Scholar
[16] Marabelli, F., Amiotti, M., Bellani, V., Guizzetti, G., Borghesi, A., Lagomarsino, S., and Scarinci, F., Proc. 21st ICPS, ed. by Jiang, P. and Zheng, H.Z. (World Sci., Singapore, 1992) p. 209.Google Scholar