Hostname: page-component-78c5997874-mlc7c Total loading time: 0 Render date: 2024-11-09T21:46:22.604Z Has data issue: false hasContentIssue false

Percolation properties of cellular composite systems

Published online by Cambridge University Press:  17 March 2011

C. Chiteme
Affiliation:
School of Physics and Material Physics Institute, University of the Witwatersrand, Private Bag 3, Wits 2050, Johannesburg, South Africa.
D.S. McLachlan
Affiliation:
School of Physics and Material Physics Institute, University of the Witwatersrand, Private Bag 3, Wits 2050, Johannesburg, South Africa.
Get access

Abstract

Percolation phenomena were studied in a series of six composites with a cellular structure. Measurements made on the composites include dc and ac electrical conductivity, dielectric constant, 1/for flicker noise and magnetoresistance. Results arising from these extensive measurements were fitted to the percolation power laws and a phenomenological equation to give various exponents, which are presented, discussed and compared.

Type
Research Article
Copyright
Copyright © Materials Research Society 2002

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Chiteme, C and McLachlan, D.S., submitted to press.Google Scholar
2. Chiteme, C and McLachlan, D.S., submitted to press.Google Scholar
3. Chiteme, C, McLachlan, D.S. and I Balberg, submitted to press.Google Scholar
4. Kusy, R. P., J. Appl. Phys. 48, 5301 (1977).Google Scholar
5. Stanley, H. E., J. Phys. A10, L211 (1977).Google Scholar
6. Coniglio, A., J. Phys. A15, 3829 (1982).Google Scholar
7. McLachlan, D. S., Chiteme, C., Heiss, W. D. and Wu, Junjie, these proceedings.Google Scholar
8. Wu, Junjie, and McLachlan, D.S., Phys. Rev. B56, 1238 (1997).Google Scholar
9. Wu, Junjie, and McLachlan, D.S., Phys. Rev. B58, 14880 (1998).Google Scholar
10. Kogut, P. M. and Stanley, J. P., J. Phys. C 12, 2151 (1979).Google Scholar
11. Halperin, B. I., Feng, S. and Sen, P, Phys. Rev. Lett. 54, 239 (1985).Google Scholar
12. Feng, S., Halperin, B. I. and Sen, P, Phys. Rev B 35, 197 (1987).Google Scholar
13. Balberg, I., Phys. Rev. B 57, 13351 (1998).Google Scholar
14. Balberg, I., Phil Mag. B 56, 991 (1987).Google Scholar
15. Hooge, F. N., Phys. Rev. Lett. A29, 139 (1969).Google Scholar
16. Nandi, U. N., Mukherjee, C. D., and Bardhan, K. K., Phys. Rev. B54, 12903 (1996).Google Scholar
17. Rammal, R., Tannous, C. and Tremblay, A.M.S., Phys. Rev. A31, 2662 (1985).Google Scholar
18. Rudman, D. A., Calabrese, J. J., and Garland, J. C., Phys. Rev. B33, 1456 (1986).Google Scholar
19. Pierre, C., Deltour, R., Bentum, Van J., Perenboom, J. A. A. J., Rammal, R., Phys. Rev. B42, 3386 (1990).Google Scholar
20. Bergman, D. J., Phil. Mag. B56, 983 (1987).Google Scholar
21. Rhode, M. and Micklitz, H., Phys. Rev. B 36, 7572 (1987).Google Scholar
22. Rhode, M. and Micklitz, H., Physica A 157, 120 (1989).Google Scholar