Hostname: page-component-586b7cd67f-rcrh6 Total loading time: 0 Render date: 2024-11-29T07:27:00.205Z Has data issue: false hasContentIssue false
  • English
  • Français

Organic Light-Emitting Diodes Using Triphenylamine Based Hole Transporting Materials

Published online by Cambridge University Press:  14 March 2011

Hisayoshi Fujikawa ,
Masahiko Ishii ,
Shizuo Tokito  and
Yasunori Taga
Hisayoshi Fujikawa
Affiliation:
TOYOTA Central Research and Development Labs., Inc. Nagakute, Aichi, 480-1192, JAPAN
Masahiko Ishii
Affiliation:
TOYOTA Central Research and Development Labs., Inc. Nagakute, Aichi, 480-1192, JAPAN
Shizuo Tokito
Affiliation:
TOYOTA Central Research and Development Labs., Inc. Nagakute, Aichi, 480-1192, JAPAN
Yasunori Taga
Affiliation:
TOYOTA Central Research and Development Labs., Inc. Nagakute, Aichi, 480-1192, JAPAN
Get access

Abstract

The durability of the tris(8-quinolinolato) aluminum based light-emitting diode (LED) is related to the thermal stability of the hole transport layer. Several linear linkage triphenylamine oligomers were used for the hole transport layer. The thermal stability was clearly seen to depend on a glass transition temperature (Tg) of the hole transporting material, and a linear relationship between the Tg and the thermal stability was found. A lowering of “turn-on voltage” for light emission and an increase of luminous efficiency with increasing temperature was also observed. Excellent durability of the organic LED with a tetramer of triphenylamine was achieved at a high temperature of 120°C. Our results indicate that the linear linkage of triphenylamine leads to a high Tg and high device performance at high temperatures.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 621: Symposia Q/R – Electron-Emissive Materials, Vacuum Microelectronics… , 2000 , Q3.4.1
Copyright
Copyright © Materials Research Society 2000

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Tang, C. W. and VanSlyke, S. A., Appl. Phys. Lett. 51, 913 (1987)Google Scholar
2. Adachi, C., Tokito, S., Tsutsui, T., and Saito, S., Jpn. J. Appl. Phys. 27, L269 (1988)Google Scholar
3. Burroughes, J. H., Bradley, D. D., Brown, A. R., Marks, R. N., Mackay, K., Friend, R. H., Burns, P. L., and Holmes, A. B., Nature 347, 539 (1990)Google Scholar
4. Kido, J., Kimura, M., and Nagai, K., Science 267, 1332 (1995)Google Scholar
5. Tokailin, H., Matsuura, M., Higashi, H., Hosokawa, C., and Kusumoto, T., Proc. SPIE 1910, 38 (1993)Google Scholar
6. Fukuda, Y., Miyaguchi, S., Ishizuka, S., Wakimoto, T., Funai, J., Kubota, H., Watanabe, T., Ochi, H., Sakamoto, T., Tsuchida, M., Ohshita, I., Nakada, H., and Tohma, T., SID 99 Digest, p.430 (1999)Google Scholar
7. Shirota, Y., Kuwabara, Y., Inada, H., Wakimoto, T., Nakada, H., Yonemoto, Y., Kawami, S., and Imai, K., Appl. Phys. Lett. 65, 807 (1994)Google Scholar
8. Adachi, C., Tsutsui, T., and Saito, S., Appl. Phys. Lett. 56, 799 (1990)Google Scholar
9. Sano, T., Hamada, Y. and Shibata, K., Inorganic and organic electroluminescence/EL96 Berlin, pp. 249–254, (Wissenschaft und Technik Verlag, Berlin, 1996)Google Scholar
10. Han, E., Do, L., Niidome, Y. and Fujihira, M., Chem. Lett., pp. 969–972 (1994)Google Scholar
11. Tokito, S., and Taga, Y., Appl. Phys. Lett. 66, 673 (1995)Google Scholar
12. Tokito, S., Tanaka, H., Noda, K., Okada, A., and Taga, Y., Appl. Phys. Lett. 69, 878 (1996)Google Scholar
13. Tokito, S., Tanaka, H., Noda, K., Okada, A., and Taga, Y., IEEE Trans. Electron Devices, 44, 1239 (1997).Google Scholar
14. Tokito, S., Noda, K., Shimada, K., Inoue, S., Kimura, M., Sawaki, Y., Taga, Y., Thin Solid Films 363, 290 (2000)Google Scholar
15. Tanaka, H., Tokito, S., Taga, Y., and Okada, A., J. Chem. Soc., Chem. Commun., 2175 (1996)Google Scholar
16. Stolka, M., Yanus, J. F., and Pai, D. M., J. Phys. Chem. 88, 4707 (1984)Google Scholar
17. Adachi, C., Nagai, K., and Tamoto, N., Appl. Phys. Lett. 66, 2679 (1995)Google Scholar
18. Naka, S., Okada, H., Onnagawa, H., and Tsutsui, T., Appl. Phys. Lett. 76, 197 (2000)Google Scholar
19. Burrows, P. E., Forrest, S. R., Appl. Phys. Lett. 64, 2285 (1994)Google Scholar
20. Shi, J. and Tang, C. W., Appl. Phys. Lett. 70, 1665 (1997)Google Scholar