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Optical and Electrical Properties of Metal Nanoclusters Embedded in a Dielectric Medium

Published online by Cambridge University Press:  01 February 2011

Frédéric Dumas-Bouchiat ,
Syed Salman Asad ,
Corinne Champeaux ,
Alain Catherinot ,
Aurelian Stanescu Crunteanu  and
Pierre Blondy
Frédéric Dumas-Bouchiat
Affiliation:
[email protected], Université de Limoges, SPCTS UMR CNRS 6638, France
Syed Salman Asad
Affiliation:
[email protected], Université de Limoges, SPCTS UMR CNRS 6638, France
Corinne Champeaux
Affiliation:
[email protected], Université de Limoges, SPCTS UMR CNRS 6638, France
Alain Catherinot
Affiliation:
[email protected], Université de Limoges, SPCTS UMR CNRS 6638, France
Aurelian Stanescu Crunteanu
Affiliation:
[email protected], Université de Limoges, IRCOM UMR CNRS 6615, France
Pierre Blondy
Affiliation:
[email protected], Université de Limoges, IRCOM, UMR CNRS 6615, France
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Abstract

We present the synthesis and optical and electrical characterization of amorphous nanocomposite layers made of metallic nanoclusters embedded in an alumina (Al2O3) matrix (nc-M:Al2O3 with M= Ag, Cu and Co). The nanocomposites, obtained by a pulsed laser deposition (PLD)- derived method, exhibit specific optical plasma resonance absorption in the visible and UV region. The position of the absorption peaks depends on the cluster type and gives information about its dimension and nature (metal or oxide). The results fit well with the size and shape distribution recorded by transmission electron microscopy (TEM). Electrical properties and conduction mechanisms of nc-Co:Al2O3 layers were investigated for different doping levels and in temperature range of 303-473 K. It was concluded that space charge limited currents theory (SCLC) can be assumed as major conduction mechanism, at least for intermediate doping levels (∼9 vol.%).

Keywords

nanostructureoptical propertieselectrical properties
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 888: Symposium V – Materials and Devices for Smart Systems II , 2005 , 0888-V05-06
Copyright
Copyright © Materials Research Society 2006

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References

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