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Open Applicator Analysis For Material Joining And Dielectric Measurements
Published online by Cambridge University Press: 10 February 2011
Abstract
Resonant internal and radiated external electromagnetic fields of an open coaxial structure are analyzed using FDTD. These fields are characterized for two structures, with and without a quarter-wave choke. Techniques utilized to obtain a steady state solution are discussed. Good agreement with field measurements is obtained. This moveable open applicator is convenient for creating intense hot zones as required in ceramic joining. It is also suitable for the measurement of surface dielectric properties of planar materials at room or elevated temperatures.
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