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On-Line Transverse Control of Materials by Means of Microwave Imaging Techniques
Published online by Cambridge University Press: 28 February 2011
Abstract
This paper analyzes of the impact of a new generation of microwave sensors on the transverse control of conveyed products and materials. Such sensors, resulting from recent developments in microwave imaging technology, offer significant improvements in comparison to other more classical microwave sensors. The main features of the new sensors are presented and discussed.
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- Copyright © Materials Research Society 1991
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