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On In-Situ Study of Dislocation/Grain Boundary Interactions Using X-ray Topography and Tem

Published online by Cambridge University Press:  21 February 2011

Ian Baker  and
Fuping Liu
Ian Baker
Affiliation:
Dartmouth College, Thayer School of Engineering, Hanover, New Hampshire 03755, USA
Fuping Liu
Affiliation:
Dartmouth College, Thayer School of Engineering, Hanover, New Hampshire 03755, USA
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Abstract

The advantages and disadvantages of in-situ straining using both synchrotron x-ray topography and transmission electron microscopy for examining dislocation/grain boundary interactions are compared and examples given of the use of each technique. For x-ray topography, studies on ice polycrystals are discussed. Ice is well-suited for x-ray topographic studies since it has both low absorption and can be produced with a low dislocation density. Stress concentrations have been observed at grain boundaries in ice which are partially relieved by generation of 1/3<1120> dislocations. Interestingly, grain boundary generation of dislocations completely overwhelms lattice generation mechanisms. Examples of transmission electron microscope in-situ straining studies include dislocation/grain boundary interactions in L12-structured and B2-structured intermetallics. Slip transmission across grain boundaries by dislocations gliding ahead of an advancing crack is a principal feature of these studies. A significant advantage of the such studies is their inherently high resolution. However, the dislocation behavior is dominated by the inherent thinness of the specimens.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 319: Symposia CB – Defect-Interface Interactions , 1993 , 203
Copyright
Copyright © Materials Research Society 1994

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