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Oled Matrix-Displays

Published online by Cambridge University Press:  15 February 2011

Dirk Metzdorf
Affiliation:
Institut fuer Hochfrequenztechnik, Technische Universitaet Braunschweig, Schleinitzstr. 22, 38106 Braunschweig, Germany.
Eike Becker
Affiliation:
Institut fuer Hochfrequenztechnik, Technische Universitaet Braunschweig, Schleinitzstr. 22, 38106 Braunschweig, Germany.
Thomas Dobbertin
Affiliation:
Institut fuer Hochfrequenztechnik, Technische Universitaet Braunschweig, Schleinitzstr. 22, 38106 Braunschweig, Germany.
Soeren Hartmann
Affiliation:
Institut fuer Hochfrequenztechnik, Technische Universitaet Braunschweig, Schleinitzstr. 22, 38106 Braunschweig, Germany.
Dirk Heithecker
Affiliation:
Institut fuer Hochfrequenztechnik, Technische Universitaet Braunschweig, Schleinitzstr. 22, 38106 Braunschweig, Germany.
Hans-Hermann Johannes
Affiliation:
Institut fuer Hochfrequenztechnik, Technische Universitaet Braunschweig, Schleinitzstr. 22, 38106 Braunschweig, Germany.
Anis Kammoun
Affiliation:
Institut fuer Hochfrequenztechnik, Technische Universitaet Braunschweig, Schleinitzstr. 22, 38106 Braunschweig, Germany.
Henning Krautwald
Affiliation:
Institut fuer Hochfrequenztechnik, Technische Universitaet Braunschweig, Schleinitzstr. 22, 38106 Braunschweig, Germany.
Thomas Riedl
Affiliation:
Institut fuer Hochfrequenztechnik, Technische Universitaet Braunschweig, Schleinitzstr. 22, 38106 Braunschweig, Germany.
Christian Schildknecht
Affiliation:
Institut fuer Hochfrequenztechnik, Technische Universitaet Braunschweig, Schleinitzstr. 22, 38106 Braunschweig, Germany.
Daniel Schneider
Affiliation:
Institut fuer Hochfrequenztechnik, Technische Universitaet Braunschweig, Schleinitzstr. 22, 38106 Braunschweig, Germany.
Wolfgang Kowalsky
Affiliation:
Institut fuer Hochfrequenztechnik, Technische Universitaet Braunschweig, Schleinitzstr. 22, 38106 Braunschweig, Germany.
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Abstract

The field of organic light emitting diodes (OLEDs) has matured considerably within recent years and first products are commercially available. After a brief review of the improvement of individual OLEDs we will focus on research topics for the preparation of passive matrix (PMOLED), active matrix (AMOLED) and full color displays. To date, the properties of organic matrix displays basically meet consumer product requirements. Anyhow an industrial cheap fabrication technology for reliable displays is not established yet. To meet the industrial demands for device fabrication a new horizontal in-line vacuum system for a massproduction compatible device manufacturing was installed. For material saving large area coatings the system accommodates up to 7” × 13” substrates. Different PMOLED-Displays based on vacuum deposited organic compounds have been prepared by various fabrication techniques. We demonstrate a 2 inch organic display with 24 × 32 single pixels and 0.9 × 0.9 mm2 pitch whereby cathode texture was achieved using photoresist barriers featuring a distinct undercut. Due to the inherent limitations of multiplexing and in order to satisfy the need for large area, high resolution displays the basic concepts for an active matrix addressing scheme are dealt with. In this regard transparent and electrically inverted top-side emitting diodes (IOLEDs) will be demonstrated. The latter are advantageous for the incorporation of powerful nchannel thin film transistors in the AMOLED driver backplanes. An all-organic smart pixel device comprising a single Pentacene based organic field effect transistor (OFET) and a conventional OLED was successfully prepared. Furthermore a new flash-sublimation technique for the spatially selective deposition of small organic molecules will be presented. We prepared OLEDs comprising flash-deposited Tris-(-8-hydroxyquinoline) aluminium (Alq3) and Alq3 doped with DCM2 which demonstrate the suitability of this technique for preparation of fullcolor displays based on small organic molecules.

Type
Research Article
Copyright
Copyright © Materials Research Society 2003

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References

1. Hebner, T. R., Wu, C. C., Marcy, D., Lu, M. H., and Sturm, J. C., Appl. Phys. Lett. 72, 519 (1998).Google Scholar
2. Böhler, A., Urbach, P., Schöbel, J., Dirr, S., Johannes, H.-H., Wiese, S., Ammermann, D., and Kowalsky, W., Physica E 2, 562 (1998).Google Scholar
3. Semenza, P. D., 7. EUROFORUM-Jahrestagung: Displays 2002 (2002).Google Scholar
4. Cropper, A. D., Cok, R. S., and Feldman, R. D., Proceedings of SPIE, 4105 (2001).Google Scholar
5. Tang, C. W. and VanSlyke, S. A., Appl. Phys. Lett. 51, 913 (1987).Google Scholar
6. Tang, C. W., VanSlyke, S. A., J. Appl. Phys, 65, 3610 (1989).Google Scholar
7. Hung, L. S., Tang, C. W., and Mason, M. G., Appl. Phys. Lett. 70, 152 (1997).Google Scholar
8. Nakayama, K., Yahagi, T., Nakada, H., Tohama, T., Watanab, T., Yoshida, K., Miyaguchi, S., Jpn. J. Appl. Phys. 36, L1555 (1997).Google Scholar
9. Servati, P., Prakash, S., Nathan, A., and Py, C., J. Vac. Sci. Technol. A, 20, 1374 (2002).Google Scholar
10. He, Y., Hattori, R, and Kanicki, J., IEEE Trans. Electron Devices, 48, 1322 (2001).Google Scholar
11. Wu, C. C., Theiss, S. D., Gu, G., Lu, M. H., Sturm, J. C., Wagner, S., and Forrest, S. R., IEEE Trans. Electron Devices, 18, 609 (1997).Google Scholar
12. He, Y., R Hattori, and Kanicki, J., Jpn. J. Appl. Phys., 40, 1199 (2001).Google Scholar
13. Stewart, M., Howell, R. S., Pires, L., and Hatalis, M. K., IEEE Trans. Electron Devices, 48, 845 (2001).Google Scholar
14. Hatalis, M. K., Stewart, M., Tang, C., and Burtis, J., SPIE Vol. 3057, 2767 (1997).Google Scholar
15. Meng, Z., Chen, H., Qiu, C., Wang, L., Kwok, H. S., and Wong, M., IEDM Tech. Dig, 611 (2000).Google Scholar
16. Stewart, M., Howell, R. S., Pires, L., Hatalis, M. K., Howard, W., and Prache, O., IEDM Tech. Dig, 871 (1998).Google Scholar
17. Mathine, D. L., Woo, H. S., He, W., Kim, T. W., Kippelen, B., and Peyghambarian, N., Appl. Phys. Lett., 76, 3849 (2000).Google Scholar
18. Heinrich, L. M. H., Müller, J., Hilleringmann, U., Goser, K. F., Holmes, A., Hwang, D. H., and Stern, R., IEEE Trans. Electron Devices, 44, 1249 (2001).Google Scholar
19. Dobbertin, T., Kroeger, M., Heithecker, D., Schneider, D., Metzdorf, D., Neuner, H., Becker, E., Johannes, H.-H., and Kowalsky, W., Appl. Phys. Lett. 82, No. 2, 248 (2003).Google Scholar
20. Stuart, R. V., Vaccum Technology, Thin Films and Sputtering (New York Acad. Press, 1983 Google Scholar
21. Zhou, X., Pfeiffer, M., Huang, J. S., Blochwitz-Nimoth, J., Qin, D. S., Werner, A., Drechsel, J., Maenning, B., and Leo, K., Appl. Phys. Lett. 81, 922 (2002).Google Scholar
22. Bulovic, V., Tian, P., Burrows, P. E., Gokhale, M.R., and Forrest, S. R., Appl. Phys. Lett. 70, 2954 (1997).Google Scholar
23. , Sheraw et al., Appl. Phys. Lett. 80, No. 6, 10881090 (2002).Google Scholar
24. , Huitema et al., Adv. Mat. 14, No. 17, 12011204 (2002).Google Scholar
25. , Sheraw et al., 42nd Electronic Materials Conference Digest, 24-25 (June 2000).Google Scholar
26. Sakaguchi, Y., Tada, H., Tanaka, T., Kitazume, E., Mori, K., Kawashima, S., and Suzuki, J. Society for Information Display (SID'02) Digest, 1182 (2002).Google Scholar
27. Sasaoka, T., Sekiya, M., Yumoto, A., Yamada, J., Hirano, T., Iwase, Y., Yamada, T., Ishibashi, T., Mori, T., Asano, M., Tamura, S., and Urabe, T., Society for Information Display (SID'01) Digest, 384 (2002).Google Scholar
28. Tada, K., and Onoda, M., Jpn. J. Appl. Phys. 38, L1143 (1999).Google Scholar
29. Nakamura, A., Tada, T., Mizukami, M., Hirose, S., and Yagu, S., Appl. Phys. Lett. 80, 2189 (2002).Google Scholar
30. Becker, E., Riedl, T., Dobbertin, T., Schneider, D., Heithecker, D., Metzdorf, D., Johannes, H.H., and Kowalsky, W., Appl. Phys. Lett. 82, 2712 (2003).Google Scholar
31. Böhler, A., Dirr, S., Johannes, H.-H., Ammermann, D., and Kowalsky, W., Synth. Met. 91, 95 (1997).Google Scholar
32. Bulovic, V., Shoustikov, A., Baldo, M. A., Bose, E., Kozlov, V. G., Thompson, M. E., and Forrest, S. R., Chem. Phys. Lett. 287, 455 (1998).Google Scholar