Hostname: page-component-586b7cd67f-r5fsc Total loading time: 0 Render date: 2024-11-25T15:24:53.327Z Has data issue: false hasContentIssue false
  • English
  • Français

Octadecyltriethoxysilane Surface Modification of Zinc Oxide

Published online by Cambridge University Press:  01 February 2011

Cary Allen ,
Darick J. Baker ,
Thomas E. Furtak ,
Reuben T. Collins ,
Matthew S. White ,
Dane T. Gillaspie ,
Dana C. Olson  and
David S. Ginley
Cary Allen
Affiliation:
[email protected], Colorado School of Mines, Physics, 1523 Illinois St., Golden, CO, 80401, United States, 970 946 6656
Darick J. Baker
Affiliation:
[email protected], Colorado School of Mines, Physics, 1523 Illinois St., Golden, CO, 80401, United States
Thomas E. Furtak
Affiliation:
[email protected], Colorado School of Mines, Physics, 1523 Illinois St., Golden, CO, 80401, United States
Reuben T. Collins
Affiliation:
[email protected], Colorado School of Mines, Physics, 1523 Illinois St., Golden, CO, 80401, United States
Matthew S. White
Affiliation:
[email protected], National Renewable Energy Laboratory, 1617 Cole Blvd., Golden, CO, 80401, United States
Dane T. Gillaspie
Affiliation:
[email protected], National Renewable Energy Laboratory, 1617 Cole Blvd., Golden, CO, 80401, United States
Dana C. Olson
Affiliation:
[email protected], National Renewable Energy Laboratory, 1617 Cole Blvd., Golden, CO, 80401, United States
David S. Ginley
Affiliation:
[email protected], National Renewable Energy Laboratory, 1617 Cole Blvd., Golden, CO, 80401, United States
Get access

Abstract

Zinc Oxide (ZnO) is actively investigated for hybrid organic inorganic device applications. The interface greatly influences the electronic properties of these devices. Molecular surface modification of ZnO is being investigated for its potential to control the alignment of energy levels, charge transfer, as well as, interfacial chemical characteristics that influence device fabrication. In this study, octadecyltriethoxysilane (OTES) treatments of thin film ZnO produced by sol-gel decomposition were explored. The ZnO films were hydroxylated and then modified using OTES in solution. The condensation reaction of the OTES at the surface was promoted by the addition of a protoamine catalyst. Contact angle and infrared spectroscopy studies confirmed the surface modification and indicated that the coverage of the OTES was submonolayer. The modified ZnO films were reproducible and stable for long periods. The effects of the modification on subsequently spin-cast poly[3-hexylthiophene](P3HT) and on hybrid ZnO/P3HT organic solar cell performance are discussed.

Keywords

sol-gelorganicoxide
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 1091: Symposium AA – Conjugated Organic Materials–Synthesis, Structure, Device and Applications , 2008 , 1091-AA05-78
Copyright
Copyright © Materials Research Society 2008

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

[1] Olson, D. C.; Piris, J.; Collins, R. T.; Shaheen, S. E.; Ginley, D. S. Thin Solid Films 2006, 496, 26–29.Google Scholar
[2] Regan, O. Gratzel, B. M. Nature 1991, 353, 737–740.Google Scholar
[3] Burroughes, J. H.; Bradley, D. D. C.; Brown, A. R.; Marks, R. N.; Mackay, K.; Friend, R. H.; Burns, P. L.; Holmes, A. B. Nature 1990, 347, 539–541.Google Scholar
[4] Haque, S. A.; Koops, S.; Tokmoldin, N.; Durrant, J. R.; Huang, J.; Bradley, D. D. C.; Palomares, E. Advanced Materials 2007, 19, 683–687.Google Scholar
[5] White, M. S.; Olson, D. C.; Shaheen, S. E.; Kopidakis, N.; Ginley, D. S. Applied Physics Letters 2006, 89, 143517.Google Scholar
[6] Beek, W. J. E.; Wienk, M. M.; Kemerink, M.; Yang, X.; Janssen, R. A. J. J. Phys. Chem. B 2005, 109, 9505–9516.Google Scholar
[7] Coakley, K. M.; Mcgehee, M. D. Applied Physics Letters 2003, 83, 3380–3382.Google Scholar
[8] Baxter, J. B.; Aydil, E. S. Applied Physics Letters 2005, 86, 053114.Google Scholar
[9] Ravirajan, P.; Peiro, A. M.; Nazeeruddin, M. K.; Graetzel, M.; Bradley, D. D. C.; Durrant, J. R.; Nelson, J. J. Phys. Chem. B 2006, 110, 7635–7639.Google Scholar
[10] Gregg, B. A. Mater. Res. Bull. 2005, 30, 20–22.Google Scholar
[11] Kudo, N.; Honda, S.; Shimazaki, Y.; Ohkita, H.; Ito, S.; Benten, H. Applied Physics Letters 2007, 90, 183513.Google Scholar
[12] Chong, L.W.; Lee, Y.L.; Wen, T.C. Thin Solid Films 2007, 515, 2833–2841.Google Scholar
[13] Goh, C.; Scully, S. R.; Mcgehee, M. D. Journal of Applied Physics 2007, 101, 114503+.Google Scholar
[14] Sagiv, J. J. Am. Chem. Soc. 1980, 102, 92–98.Google Scholar
[15] Schwartz, D. K. Annu. Rev. Phys. Chem. 2001, 52, 107–137.Google Scholar
[16] Salleo, A.; Chabinyc, M. L.; Yang, M. S.; Street, R. A. Applied Physics Letters 2002, 81, 4383–4385.Google Scholar
[17] Peet, J.; Kim, J. Y.; Coates, N. E.; Ma, W. L.; Moses, D.; Heeger, A. J.; Bazan, G. C. Nat Mater 2007, 6, 497–500.Google Scholar
[18] Walba, D. M.; Liberko, C. A.; Korblova, E.; Farrow, M.; Furtak, T. E.; Chow, B. C.; Schwarz, D. K.; Freeman, A. S.; Douglas, K.; Williams, S. D.; Klittnick, A. F.; Clark, N. A. Liquid Crystals 2004, 31, 481–489.Google Scholar
[19] Blitz, J. Shreedhara, P.,; Leyden, D. E. Journal of Colloid and Interface Science 1988, 126, 387–392.Google Scholar
[20] Ohyama, M.; Kouzuka, H.; Yoko, T. Thin Solid Films 1997, 306, 78–85.Google Scholar
[21] Stalder, A. F.; Kulik, G.; Barbieri, L.; Hoffmann, P. Colloids Surf., A 2006, 286, 92–103.Google Scholar
[22] Asakuma, N.; Fukui, T.; Toki, M.; Awazu, K.; Imai, H. Thin Solid Films 2003, 445, 284–287.Google Scholar
[23] Nuzzo, R. G.; Dubois, L. H.; Allara, D. L. Journal of American Chemecial Society 1990, 112, 558–569.Google Scholar
[24] Howland, M. C.; Johal, M. S.; Parikh, A. N. Langmuir 2005, 21, 10468–10474.Google Scholar
[25] Parikh, A. N.; Allara, D. L.; Azouz, I. B.; Rondelez, F. Journal of Physical Chemistry 1994, 98, 7577–7590.Google Scholar
[26] Macphail, R. A.; Strauss, H. L.; Snyder, R. G.; Elliger, C. A. Journal of Physical Chemistry 1984, 88, 334–341.Google Scholar
[27] Snyder, R. G.; Strauss, H. L.; Elliger, C. A. Journal of Physical Chemistry 1982, 86, 5145–5150.Google Scholar
[28] Kulkarni, S. A.; Kakade, B. A.; Mulla, I. S.; Pillai, V. K. Journal of Colloid and Interface Science 2006, 299, 777–784.Google Scholar
[29] Wang, G.; Swensen, J.; Moses, D.; Heeger, A. J. Journal of Applied Physics 2003, 93, 6137–6141.Google Scholar