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Observation of Structural Defects in Epitaxial Ferroelectric Bismuth Titanate/PrBa2Cu3O7 Superconductor thin Film Heterostructures on LaAlO3

Published online by Cambridge University Press:  25 February 2011

Subodh Ghonge ,
Edward Goo  and
R. Ramesh
Subodh Ghonge
Affiliation:
Department of Materials Science and Engineering, University of Southern California, Los Angeles
Edward Goo
Affiliation:
Department of Materials Science and Engineering, University of Southern California, Los Angeles
R. Ramesh
Affiliation:
Bellcore, Red Bank, New JersAenyg e0le8s5,7 4California 90089
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Abstract

Epitaxial PrBa2Cu3O7 superconductor/ferroelectric bismuth titanate heterostructures grown on [001] oriented LaAlO3 by pulsed laser deposition are being studied. X-ray diffraction studies of the heterostructures have shown that all the layers grow in the c-axis orientation. In this investigation, the early stages of ferroelectric film growth have been studied using transmission electron microscopy (TEM) of crosssectioned samples. High resolution lattice imaging has been carried out to study the atomic structure of the ferroelectric/superconductor growth interface and the defect structure of the ferroelectric film.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 243: Symposium G – Ferroelectric Thin Films II , 1991 , 399
Copyright
Copyright © Materials Research Society 1992

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