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O2 Plasma Treatment of Al Layer on Metal Anode to Improve the Performance of Organic Light-Emitting Devices

Published online by Cambridge University Press:  26 February 2011

Su Hwan Lee ,
Dong-Won Shin ,
Sung-Jun Kim ,
Yoon Ho Kang ,
Gon-Sub Lee  and
Jea-gun Park
Su Hwan Lee
Affiliation:
[email protected], Hanyang University, Electrical & Computer Engineering, #101 HIT, Hanyang University, Haengdang-dong, Seongdong-gu, Seoul, 133-791, Korea, Republic of
Dong-Won Shin
Affiliation:
[email protected], Hanyang University, Electrical & Computer Engineering, #101 HIT, Hanyang University, Haengdang-dong, Seongdong-gu, Seoul, 133-791, Korea, Republic of
Sung-Jun Kim
Affiliation:
[email protected], Hanyang University, Electrical & Computer Engineering, #101 HIT, Hanyang University, Haengdang-dong, Seongdong-gu, Seoul, 133-791, Korea, Republic of
Yoon Ho Kang
Affiliation:
[email protected], Hanyang University, Electrical & Computer Engineering, #101 HIT, Hanyang University, Haengdang-dong, Seongdong-gu, Seoul, 133-791, Korea, Republic of
Gon-Sub Lee
Affiliation:
[email protected], Hanyang University, Electrical & Computer Engineering, #101 HIT, Hanyang University, Haengdang-dong, Seongdong-gu, Seoul, 133-791, Korea, Republic of
Jea-gun Park
Affiliation:
[email protected], Hanyang University, Electrical & Computer Engineering, #101 HIT, Hanyang University, Haengdang-dong, Seongdong-gu, Seoul, 133-791, Korea, Republic of
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Abstract

A gold and aluminum layer was investigated as an anode for organic light-emitting devices (OLEDs). By pretreating the ultrathin aluminum layer in an oxygen (O2) plasma, the hole injection from the metal anode to the organic layer was greatly enhanced. The fabricated OLEDs demonstrated improved current density and luminance characteristics as compared with other devices using a gold anode and an aluminum layer not treated with an oxygen plasma.

Keywords

organicoptical propertiesbarrier layer
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 965: Symposium S – Organic Electronics – Materials, Devices and Applications , 2006 , 0965-S03-16
Copyright
Copyright © Materials Research Society 2007

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References

REFERENCES

1. Tang, C. W., VanSlyke, S. A., Appl. Phys. Lett. 51, 913 (1987).Google Scholar
2. Meng, Z., Wong, M., IEEE Trans. Electron Devices 49, 991 (2002).Google Scholar
3. Adachi, C., Tsutsui, T., Saito, S., Appl. Phys. Lett. 55, 1489 (1989).Google Scholar
4. Tang, C. W., VanSlyke, S. A., Chen, C. H., J. Appl. Phys. 85, 3610 (1989).Google Scholar
5. Friend, R. H., Gymer, R. W., Holmes, A. B., Burroughes, J. H., Marks, R. N., Taliani, C., Bradley, D. D. C., Santos, D. A. Dos, Bredas, J. L., Logdlund, M., Salaneck, W. R., Nature (London) 397, 121 (1999).Google Scholar
6. Shi, J., Tang, C. W., Appl. Phys. Lett. 70, 1665 (1997).Google Scholar
7. Kanno, Hiroshi, Sun, Yiru, andForrest, Stephen R., Appl. Phys. Lett. 86, 263502 (2005)Google Scholar
8. So, S. K., Choi, W. K., Cheng, C. H., Leung, L. M., Kwong, C. F., Appl. Phys. A 68, 447 (1999).Google Scholar
9. Reynolds, K. J., Frey, G. L., andFriend, R. H., Appl. Phys. Lett. 82, 1123 (2003)Google Scholar
10. Wu, C. C., Wu, C. I., Sturm, J. C., Kahn, A., Appl. Phys. Lett. 70, 1348 (1997).Google Scholar
11. Kim, J. S., Friend, R. H., Cacialli, F., Appl. Phys. Lett. 74, 3084 (1999).Google Scholar
12. Hung, L. S., Zheng, L. R., Mason, M. G., Appl. Phys. Lett. 78, 673 (2001).Google Scholar
13. Gu, G., Forrest, S. R., IEEE J. Sel. Top. Quantum Electron. 4, 83 (1998).Google Scholar
14. Johson, P. B., Christy, R. W., Phys. Rev. B 6, 4370 (1972).Google Scholar
15. Peng, H., Zhu, X., Sun, J., Xie, Z., Xie, S., Wong, M., Kwok, H. S., Appl. Phys. Lett. 87, 173505 (2005).Google Scholar
16. Michaelson, H. B., IBM J. Res. Dev. 22, 72 (1978).Google Scholar
17. Hung, L. S., Tang, C. W., Mason, M. G., Appl. Phys. Lett. 70, 152 (1997).Google Scholar
18. Parker, I. D., Kim, H. H., Appl. Phys. Lett. 64, 1774 (1994).Google Scholar
19. Osten, H. J., Liu, J. P., Gaworzewski, P., Bugiel, E., Zaumeil, P., Tech. Dig. - Int. Electron Devices Meet. 653 (2002).Google Scholar