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Nucleation and Growth of Oriented Diamond Films on Nickel Substrates

Published online by Cambridge University Press:  15 February 2011

P. C. Yang ,
W. Liu ,
D. A. Tucker ,
C. A. Wolden ,
R. F. Davis ,
J. T. Glass ,
J. T. Prater  and
Z. Sitar.
P. C. Yang
Affiliation:
Department of Materials Science and Engineering, NCSU, Raleigh, NC 27695-7919
W. Liu
Affiliation:
Department of Materials Science and Engineering, NCSU, Raleigh, NC 27695-7919
D. A. Tucker
Affiliation:
Department of Materials Science and Engineering, NCSU, Raleigh, NC 27695-7919
C. A. Wolden
Affiliation:
Department of Materials Science and Engineering, NCSU, Raleigh, NC 27695-7919
R. F. Davis
Affiliation:
Department of Materials Science and Engineering, NCSU, Raleigh, NC 27695-7919
J. T. Glass
Affiliation:
Kobe Steel USA, Inc. RTP, NC 27709.
J. T. Prater
Affiliation:
Army Research Office, RTP, NC 27709
Z. Sitar.
Affiliation:
Department of Materials Science and Engineering, NCSU, Raleigh, NC 27695-7919
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Abstract

(100) and (111) oriented diamond films were grown on similarly oriented single crystal Ni substrates using a multi-step seeding and growth process. In-situ reflection monitoring revealed large surface reflectivity changes upon heating of the seeded substrate in H2. The reflectivity change was attributed to the surface melting and dissolution of the seeding particles. The presence of atomic hydrogen lowered the eutectic melting point of the Ni-C compound from 1325°C to about 1100°C. It appeared that the molten Ni-C-H surface layer suppressed graphite formation, which is normally observed in diamond growth on Ni, and promoted diamond nucleation. The oriented diamond films were also obtained using non-diamond carbon seeding. Based on experimental observation, a proposed model is described to explain the nucleation mechanism from the molten Ni-C-H surface layer.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 423: Symposium E – III-Nitride, SiC, and Diamond Materials for Electronic , 1996 , 281
Copyright
Copyright © Materials Research Society 1996

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