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Nucleation and Growth at Reactive Interfaces Followed by Impedance Measurements

Published online by Cambridge University Press:  10 February 2011

F. Voiron ,
M. Ignat ,
T. Marieb  and
H. Fujimoto
F. Voiron
Affiliation:
LTPCM, INP Grenoble, 1130 Rue de la piscine 38402 Saint Martin d'Heres, [email protected]
M. Ignat
Affiliation:
LTPCM, INP Grenoble, 1130 Rue de la piscine 38402 Saint Martin d'Heres, [email protected]
T. Marieb
Affiliation:
INTEL, Components Research, Santa Clara
H. Fujimoto
Affiliation:
INTEL, Components Research, Santa Clara
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Abstract

To evaluate the thickness of different constitutive layers of a TiAl multilayer, two different experiments, based on impedance measurements on multilayers, have been performed. In the first one, the thickness of the layer is deduced from resistivity measurements, applied to a parallel resistance model. In the second one, the thickness of the layer is deduced from comparing of calculated and measured values of surface potentials.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 500: Symposium EE – Electrically Based Microstructural Characterization II , 1997 , 125
Copyright
Copyright © Materials Research Society 1998

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References

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