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Nuclear Magnetic Resonance as a Probe of the Topological Insulator Bi2Se3

Published online by Cambridge University Press:  09 June 2014

David M. Nisson ,
Adam P. Dioguardi ,
Peter Klavins ,
Ching H. Lin ,
Kent Shirer ,
Abigail C. Shockley ,
John Crocker  and
Nicholas J. Curro
David M. Nisson
Affiliation:
Department of Physics, University of California, Davis, Davis, CA 95616, U.S.A.
Adam P. Dioguardi
Affiliation:
Department of Physics, University of California, Davis, Davis, CA 95616, U.S.A.
Peter Klavins
Affiliation:
Department of Physics, University of California, Davis, Davis, CA 95616, U.S.A.
Ching H. Lin
Affiliation:
Department of Physics, University of California, Davis, Davis, CA 95616, U.S.A.
Kent Shirer
Affiliation:
Department of Physics, University of California, Davis, Davis, CA 95616, U.S.A.
Abigail C. Shockley
Affiliation:
Department of Physics, University of California, Davis, Davis, CA 95616, U.S.A.
John Crocker
Affiliation:
Department of Physics, University of California, Davis, Davis, CA 95616, U.S.A.
Nicholas J. Curro
Affiliation:
Department of Physics, University of California, Davis, Davis, CA 95616, U.S.A.
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Abstract

Topological insulators are a new class of materials with the ability to carry spin-polarized currents on their surfaces. Nuclear magnetic resonance (NMR) measurements can probe the magnetic interactions between specific isotopes and the electronic system of a material. We present 209Bi NMR spectra and relaxation rate data on single crystals of the topological insulator material Bi2Se3 grown under various conditions. Our NMR data on single crystals reveal a significant strength of coupling between the nuclear spins and the bulk carrier spins, suggesting that nuclear spins may have a sizeable effect on spin-polarized surface currents.

Keywords

spintronicelectronic structuresemiconducting
Type
Articles
Information
MRS Online Proceedings Library (OPL) , Volume 1691: Symposium BB – Materials for End-of-Roadmap Devices in Logic, Power and Memory , 2014 , mrss14-1691-bb12-06
Copyright
Copyright © Materials Research Society 2014 

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References

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