No CrossRef data available.
Article contents
A Novel Single Step Lapping and Chemo-Mechanical Polishing Scheme for Antimonide Based Semiconductors Using 1 µm Agglomerate-Free Alumina Slurry
Published online by Cambridge University Press: 14 March 2011
Abstract
A novel approach for a single step lapping and chemical-mechanical polishing of antimonide-based III-V compounds using agglomerate-free alumina slurries is presented. Relatively high removal rates, minimal scratching, and low surface roughness have been obtained. The effects of slurry preparation cycle on the slurry properties and chemomechanical polishing results are discussed.
- Type
- Research Article
- Information
- Copyright
- Copyright © Materials Research Society 2000