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Nondestructive Determination of the Depth of Different Texture Components in Polycrystalline Samples

Published online by Cambridge University Press:  10 February 2011

C.R. Patterson II ,
K.I. Ignatiev ,
A. Guvenilir ,
J.D. Haase ,
R. Morano ,
Z.U. Rek  and
S.R. Stock
C.R. Patterson II
Affiliation:
School of Materials Sci. & Eng. & Mechanical Properties Research Lab., Georgia Institute of Technology, Atlanta, GA 30332-0245, USA, [email protected] presently at Pratt & Whitney, West Palm Beach, FL, USA
K.I. Ignatiev
Affiliation:
School of Materials Sci. & Eng. & Mechanical Properties Research Lab., Georgia Institute of Technology, Atlanta, GA 30332-0245, USA, [email protected]
A. Guvenilir
Affiliation:
School of Materials Sci. & Eng. & Mechanical Properties Research Lab., Georgia Institute of Technology, Atlanta, GA 30332-0245, USA, [email protected] presently at Motorola, Ed Bluestein Blvd, Austin, TX, USA
J.D. Haase
Affiliation:
School of Materials Sci. & Eng. & Mechanical Properties Research Lab., Georgia Institute of Technology, Atlanta, GA 30332-0245, USA, [email protected]
R. Morano
Affiliation:
School of Materials Sci. & Eng. & Mechanical Properties Research Lab., Georgia Institute of Technology, Atlanta, GA 30332-0245, USA, [email protected] presently with US Navy
Z.U. Rek
Affiliation:
Stanford Synchrotron Radiation Laboratory, SLAC, Stanford Univ., Stanford, CA, USA
S.R. Stock
Affiliation:
School of Materials Sci. & Eng. & Mechanical Properties Research Lab., Georgia Institute of Technology, Atlanta, GA 30332-0245, USA, [email protected]
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Abstract

The surface and the center average textures (macrotexture) of plates of many alloys differ substantially, and nondestructive methods for determining the depth of different texture components would be very useful in various applications. This report evaluates one method based on recording microbeam transmission Laue patterns as a function of sample-detector separation and on tracing the diffracted rays back to their physical origin. Polychromatic synchrotron x-radiation and absorption edge filters are used. Results from sections of Al-Li 2090 T8E41 plates are reported, and limitations of the ray tracing technique are discussed

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 590: Symposium R – Applications of Synchrotron Radiation Techniques…V , 1999 , 253
Copyright
Copyright © Materials Research Society 2000

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References

REFERENCES

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